Inventor · disambiguated record
Alireza Shahdoost Moghaddam
Also filed as: MOGHADDAM ALIREZA SHAHDOOST
12 granted patents·1 pending application·37 citations·filing 2002–2023
86Inventor score
Top patents by PatentIndex Score
13 records- 0197US11852592B2Time domain multiplexed defect scannerLUMINA INSTR INC·Filed 2023·Granted Dec 26, 2023·8 cites·21 claims
- 0297US11733173B1Time domain multiplexed defect scannerLUMINA INSTR INC·Filed 2023·Granted Aug 22, 2023·8 cites·21 claims
- 0397US11255796B2Region prober optical inspectorLUMINA INSTR INC·Filed 2020·Granted Feb 22, 2022·10 cites·21 claims
- 0497US10767977B1Scattered radiation defect depth detectionLUMINA INSTR INC·Filed 2020·Granted Sep 8, 2020·8 cites·20 claims
- 0580US10648928B1Scattered radiation optical scannerLUMINA INSTR INC·Filed 2019·Granted May 12, 2020·1 cites·20 claims
- 0665US2025093274A1Dual scan beam separation with independent angle of incidence defect scanner and optical inspectorLUMINA INSTR INC·Filed 2023·Application pending·0 cites
- 0762US12146732B2Surface contour measurementLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 0861US12146830B2Slope, p-component and s-component measurementLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·21 claims
- 0961US12130243B2Angle independent optical surface inspectorLUMINA INSTRAMENTS INC·Filed 2022·Granted Oct 29, 2024·0 cites·22 claims
- 1056US12147033B2Scanning micro profilerLUMINA INSTR INC·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 1156US10641713B1Phase retardance optical scannerLUMINA INSTR INC·Filed 2019·Granted May 5, 2020·0 cites·20 claims
- 1254US11988615B2Region prober optical inspectorLUMINA INSTR·Filed 2022·Granted May 21, 2024·0 cites·21 claims
- 1343US6882437B2Method of detecting the thickness of thin film disks or wafersKLA TENCOR TECHNOLOGIES·Filed 2002·Granted Apr 19, 2005·2 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →