Inventor · disambiguated record
Mark Kassab
Also filed as: KASSAB MARK · KASSAB MARK A
59 granted patents·3 pending applications·2,069 citations·filing 1993–2021
99Inventor score
Top patents by PatentIndex Score
62 records- 0199US7818644B2Multi-stage test response compactorsRAJSKI JANUSZ·Filed 2007·Granted Oct 19, 2010·65 cites·60 claims
- 0299US6829740B2Method and apparatus for selectively compacting test responsesFiled 2003·Granted Dec 7, 2004·143 cites·23 claims
- 0399US6684358B1Decompressor/PRPG for applying pseudo-random and deterministic test patternsFiled 2000·Granted Jan 27, 2004·212 cites·41 claims
- 0499US6557129B1Method and apparatus for selectively compacting test responsesFiled 2000·Granted Apr 29, 2003·237 cites·68 claims
- 0599US6543020B2Test pattern compression for an integrated circuit test environmentFiled 2001·Granted Apr 1, 2003·143 cites·27 claims
- 0699US6327687B1Test pattern compression for an integrated circuit test environmentFiled 2000·Granted Dec 4, 2001·204 cites·30 claims
- 0798US7509546B2Test pattern compression for an integrated circuit test environmentRAJSKI JANUSZ·Filed 2006·Granted Mar 24, 2009·47 cites·21 claims
- 0898US7506232B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsRAJSKI JANUSZ·Filed 2006·Granted Mar 17, 2009·47 cites·12 claims
- 0998US7111209B2Test pattern compression for an integrated circuit test environmentRAJSKI JANUSZ·Filed 2003·Granted Sep 19, 2006·92 cites·19 claims
- 1098US7093175B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsRAJSKI JANUSZ·Filed 2003·Granted Aug 15, 2006·102 cites·12 claims
- 1196US10476740B1Data generation for streaming networks in circuitsMENTOR GRAPHICS CORP·Filed 2018·Granted Nov 12, 2019·16 cites·30 claims
- 1296US7925465B2Low power scan testing techniques and apparatusMENTOR GRAPHICS CORP·Filed 2008·Granted Apr 12, 2011·37 cites·48 claims
- 1396US7805649B2Method and apparatus for selectively compacting test responsesMENTOR GRAPHICS CORP·Filed 2009·Granted Sep 28, 2010·26 cites·21 claims
- 1496US7500163B2Method and apparatus for selectively compacting test responsesRAJSKI JANUSZ·Filed 2004·Granted Mar 3, 2009·60 cites·22 claims
- 1596US7260591B2Method for synthesizing linear finite state machinesRAJSKI JANUSZ·Filed 2004·Granted Aug 21, 2007·53 cites·20 claims
- 1696US6353842B1Method for synthesizing linear finite state machinesFiled 2000·Granted Mar 5, 2002·98 cites·35 claims
- 1795US9778316B2Multi-stage test response compactorsMENTOR GRAPHICS CORP·Filed 2016·Granted Oct 3, 2017·5 cites·13 claims
- 1895US6708192B2Method for synthesizing linear finite state machinesFiled 2003·Granted Mar 16, 2004·78 cites·19 claims
- 1994US10473721B1Data streaming for testing identical circuit blocksMENTOR GRAPHICS CORP·Filed 2018·Granted Nov 12, 2019·10 cites·28 claims
- 2094US7900104B2Test pattern compression for an integrated circuit test environmentMENTOR GRAPHICS CORP·Filed 2009·Granted Mar 1, 2011·17 cites·21 claims
- 2194US6539409B2Method for synthesizing linear finite state machinesFiled 2001·Granted Mar 25, 2003·75 cites·18 claims
- 2293US11320487B1Programmable test compactor for improving defect determinationSIEMENS IND SOFTWARE INC·Filed 2021·Granted May 3, 2022·2 cites·20 claims
- 2393US8726112B2Scan test application through high-speed serial input/outputsRAJSKI JANUSZ·Filed 2009·Granted May 13, 2014·28 cites·44 claims
- 2493US8290738B2Low power scan testing techniques and apparatusLIN XIJIANG·Filed 2011·Granted Oct 16, 2012·12 cites·31 claims
- 2593US7555689B2Generating responses to patterns stimulating an electronic circuit with timing exception pathsGOSWAMI DHIRAJ·Filed 2006·Granted Jun 30, 2009·27 cites·40 claims
- 2692US8108743B2Method and apparatus for selectively compacting test responsesRAJSKI JANUSZ·Filed 2010·Granted Jan 31, 2012·7 cites·17 claims
- 2792US7865794B2Decompressor/PRPG for applying pseudo-random and deterministic test patternsMENTOR GRAPHICS CORP·Filed 2009·Granted Jan 4, 2011·14 cites·18 claims
- 2892US7478296B2Continuous application and decompression of test patterns to a circuit-under-testRAJSKI JANUSZ·Filed 2003·Granted Jan 13, 2009·46 cites·16 claims
- 2991US11010523B1Prediction of test pattern counts for scan configuration determinationMENTOR GRAPHICS CORP·Filed 2020·Granted May 18, 2021·3 cites·22 claims
- 3091US8499209B2At-speed scan testing with controlled switching activityRAJSKI JANUSZ·Filed 2010·Granted Jul 30, 2013·12 cites·23 claims
- 3190US7877656B2Continuous application and decompression of test patterns to a circuit-under-testMENTOR GRAPHICS CORP·Filed 2009·Granted Jan 25, 2011·16 cites·19 claims
- 3289US9086454B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2013·Granted Jul 21, 2015·8 cites·13 claims
- 3386US8533547B2Continuous application and decompression of test patterns and selective compaction of test responsesRAJSKI JANUSZ·Filed 2011·Granted Sep 10, 2013·6 cites·11 claims
- 3485US7669101B2Methods for distributing programs for generating test dataUDELL JON·Filed 2008·Granted Feb 23, 2010·12 cites·24 claims
- 3585US7493540B1Continuous application and decompression of test patterns to a circuit-under-testRAJSKI JANSUZ·Filed 2000·Granted Feb 17, 2009·44 cites·37 claims
- 3684US8607107B2Test access mechanism for diagnosis based on partitioining scan chainsCHENG WU-TUNG·Filed 2011·Granted Dec 10, 2013·5 cites·24 claims
- 3783US8051352B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 1, 2011·9 cites·24 claims
- 3883US7984354B2Generating responses to patterns stimulating an electronic circuit with timing exception pathsMENTOR GRAPHICS CORP·Filed 2009·Granted Jul 19, 2011·10 cites·21 claims
- 3982US9088522B2Test scheduling with pattern-independent test access mechanismRAJSKI JANUSZ·Filed 2012·Granted Jul 21, 2015·5 cites·18 claims
- 4081US11232246B2Layout-friendly test pattern decompressorSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jan 25, 2022·1 cites·18 claims
- 4181US9720040B2Timing-aware test generation and fault simulationMENTOR GRAPHICS CORP·Filed 2015·Granted Aug 1, 2017·2 cites·17 claims
- 4277US7386778B2Methods for distributing programs for generating test dataUDELL JON·Filed 2005·Granted Jun 10, 2008·8 cites·39 claims
- 4376US8024387B2Method for synthesizing linear finite state machinesMENTOR GRAPHICS CORP·Filed 2007·Granted Sep 20, 2011·5 cites·19 claims
- 4468US9664739B2Continuous application and decompression of test patterns and selective compaction of test responsesMENTOR GRAPHICS CORP·Filed 2015·Granted May 30, 2017·1 cites·11 claims
- 4568US9651622B2Isometric test compression with low toggling activityMENTOR GRAPHICS CORP·Filed 2015·Granted May 16, 2017·1 cites·20 claims
- 4666US10120024B2Multi-stage test response compactorsMENTOR GRAPHICS CORP·Filed 2017·Granted Nov 6, 2018·0 cites·19 claims
- 4766US8560906B2Timing-aware test generation and fault simulationLIN XIJIANG·Filed 2011·Granted Oct 15, 2013·1 cites·17 claims
- 4865US10788530B1Efficient and flexible network for streaming data in circuitsMENTOR GRAPHICS CORP·Filed 2018·Granted Sep 29, 2020·0 cites·30 claims
- 4965US10775436B1Streaming networks efficiency using data throttlingMENTOR GRAPHICS CORP·Filed 2018·Granted Sep 15, 2020·0 cites·22 claims
- 5065US9026874B2Test access mechanism for diagnosis based on partitioning scan chainsMENTOR GRAPHICS CORP·Filed 2013·Granted May 5, 2015·1 cites·24 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →