Inventor · disambiguated record
Akinari Hanawa
Also filed as: HANAWA Akinari
1 granted patent·1 pending application·1 citations·filing 2015–2021
14Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP2
Top patents by PatentIndex Score
2 records- 0158US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 0244US2024186103A1Transmission Electron MicroscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →