Inventor · disambiguated record
Toshihiko Kikuchi
Also filed as: KIKUCHI TOSHIHIKO
9 granted patents·4 pending applications·105 citations·filing 1978–2021
85Inventor score
Files withTOKYO ELECTRON LTD6KIKUCHI TOSHIHIKO1OHNO TSUYOSHI1OSAKA GAS CO LTD1SNOW BRAND MILK PRODUCTS CO LTD1
Top patents by PatentIndex Score
13 records- 0180US4950446AMethod of lining pipesOSAKA GAS CO LTD·Filed 1987·Granted Aug 21, 1990·52 cites·10 claims
- 0271US4444156AWater heaterYOUEI SEISAKUSHO KK·Filed 1982·Granted Apr 24, 1984·32 cites·1 claims
- 0365US6825938B2Film thickness measuring method and step measuring methodTOSHIBA KK·Filed 2002·Granted Nov 30, 2004·14 cites·12 claims
- 0463US7663760B2Method for calculating optical constants and substrate processing systemTOKYO ELECTRON LTD·Filed 2007·Granted Feb 16, 2010·2 cites·4 claims
- 0556US6950186B2Polarization analyzing methodTOKYO ELECTRON LTD·Filed 2004·Granted Sep 27, 2005·2 cites·11 claims
- 0649US8243268B2Substrate processing apparatus, optical constant obtaining method, and storage medium storing program executing sameKIKUCHI TOSHIHIKO·Filed 2009·Granted Aug 14, 2012·2 cites·13 claims
- 0749US2022020596A1Etching processing apparatus, quartz member and plasma processing methodTOKYO ELECTRON LTD·Filed 2021·Application pending·0 cites
- 0844US8778205B2Processing method and processing systemOHNO TSUYOSHI·Filed 2009·Granted Jul 15, 2014·0 cites·2 claims
- 0938US2002065999A1Data backup system, method therefor and data storageFiled 2002·Application pending·0 cites
- 1037US2004260420A1Processing method and processing systemTOKYO ELECTRON LTD·Filed 2004·Application pending·0 cites
- 1136US10768089B2Particle collecting apparatus and particle collecting systemTOKYO ELECTRON LTD·Filed 2017·Granted Sep 8, 2020·0 cites·11 claims
- 1234US2006185793A1Substrate processing systemTOKYO ELECTRON LTD·Filed 2005·Application pending·0 cites
- 1328US4184919AMethod of gelling microbial myceliaSNOW BRAND MILK PRODUCTS CO LTD·Filed 1978·Granted Jan 22, 1980·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →