Inventor · disambiguated record
Jayesh C. Raval
Also filed as: RAVAL JAYESH C
3 granted patents·21 citations·filing 2007–2012
67Inventor score
Technology areasG11C
Top patents by PatentIndex Score
3 records- 0175US8693271B2Method of stressing static random access memories for pass transistor defectsRAVAL JAYESH C·Filed 2012·Granted Apr 8, 2014·11 cites·19 claims
- 0267US7450452B2Method to identify or screen VMIN drift on memory cells during burn-in or operationTEXAS INSTRUMENTS INC·Filed 2007·Granted Nov 11, 2008·8 cites·20 claims
- 0354US8526253B2Method of screening static random access memories for pass transistor defectsPIOUS BEENA·Filed 2011·Granted Sep 3, 2013·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →