Inventor · disambiguated record
Anne Meixner
Also filed as: MEIXNER ANNE
3 granted patents·148 citations·filing 1995–2004
75Inventor score
Files withINTEL CORP3
Top patents by PatentIndex Score
3 records- 0190US6477674B1Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elementsINTEL CORP·Filed 1999·Granted Nov 5, 2002·105 cites·37 claims
- 0270US5559745AStatic random access memory SRAM having weak write test circuitINTEL CORP·Filed 1995·Granted Sep 24, 1996·36 cites·16 claims
- 0354US7019550B2Leakage testing for differential signal transceiverINTEL CORP·Filed 2004·Granted Mar 28, 2006·7 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →