Inventor · disambiguated record
Bruce Balch
Also filed as: BALCH BRUCE · BALCH BRUCE W
5 granted patents·1 pending application·18 citations·filing 2007–2012
74Inventor score
Top patents by PatentIndex Score
6 records- 0178US8020138B2Voltage island performance/leakage screen monitor for IP characterizationIBM·Filed 2008·Granted Sep 13, 2011·9 cites·8 claims
- 0277US7803644B2Across reticle variation modeling and related reticleIBM·Filed 2007·Granted Sep 28, 2010·6 cites·4 claims
- 0368US9082875B2Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devicesIBM·Filed 2012·Granted Jul 14, 2015·2 cites·14 claims
- 0452US8298876B2Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devicesBALCH BRUCE·Filed 2009·Granted Oct 30, 2012·1 cites·21 claims
- 0543US2010174503A1Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconductor DevicesIBM·Filed 2009·Application pending·0 cites
- 0642US8521500B2Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis modelsARSOVSKI IGOR·Filed 2010·Granted Aug 27, 2013·0 cites·33 claims
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