Inventor · disambiguated record
Klaus Hallmeyer
Also filed as: HALLMEYER KLAUS
1 granted patent·1 pending application·23 citations·filing 2000–2005
41Inventor score
Files withLEICA MICROSYSTEMS2
Top patents by PatentIndex Score
2 records- 0178US6504608B2Optical measurement arrangement and method for inclination measurementLEICA MICROSYSTEMS·Filed 2000·Granted Jan 7, 2003·23 cites·24 claims
- 0232US2005225632A1Apparatus and method for acquiring a complete image of a surface of a semiconductor substrateLEICA MICROSYSTEMS·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →