Inventor · disambiguated record
Stefan Lammers
Also filed as: LAMMERS STEFAN
26 granted patents·406 citations·filing 1999–2005
96Inventor score
Top patents by PatentIndex Score
26 records- 0194US6819142B2Circuit for transforming a differential mode signal into a single ended signal with reduced standby current consumptionINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 16, 2004·63 cites·33 claims
- 0292US7239537B2Method and apparatus for current sense amplifier calibration in MRAM devicesIBM·Filed 2005·Granted Jul 3, 2007·29 cites·12 claims
- 0389US6353562B2Integrated semiconductor memory with redundant units for memory cellsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 5, 2002·56 cites·9 claims
- 0485US6594191B2Segmented write line architectureINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jul 15, 2003·40 cites·25 claims
- 0579US6825707B2Current mode logic (CML) circuit concept for a variable delay elementINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 30, 2004·21 cites·22 claims
- 0678US6847225B2CML (current mode logic) OCD (off chip driver)—ODT (on die termination) circuit for bidirectional data transmissionINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 25, 2005·26 cites·29 claims
- 0778US6577527B2Method for preventing unwanted programming in an MRAM configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 10, 2003·26 cites·6 claims
- 0875US6594176B2Current source and drain arrangement for magnetoresistive memories (MRAMs)INFINEON TECHNOLOGIES AG·Filed 2001·Granted Jul 15, 2003·22 cites·25 claims
- 0972US6539506B1Read/write memory with self-test device and associated test methodSIEMENS AG·Filed 1999·Granted Mar 25, 2003·33 cites·10 claims
- 1071US6545900B2MRAM module configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 8, 2003·18 cites·6 claims
- 1164US6744662B2Magnetoresistive memory (MRAM)INFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 1, 2004·13 cites·5 claims
- 1264US6473335B2MRAM configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 29, 2002·14 cites·5 claims
- 1359US6781896B2MRAM semiconductor memory configuration with redundant cell arraysINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 24, 2004·10 cites·16 claims
- 1450US6496423B2Chip ID register configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 17, 2002·4 cites·4 claims
- 1549US6639829B2Configuration and method for the low-loss writing of an MRAMINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 28, 2003·6 cites·24 claims
- 1648US6930915B2Cross-point MRAM array with reduced voltage drop across MTJ'sIBM·Filed 2003·Granted Aug 16, 2005·5 cites·51 claims
- 1745US7057924B2Precharging the write path of an MRAM device for fast write operationIBM·Filed 2004·Granted Jun 6, 2006·4 cites·16 claims
- 1843US6618306B2Semiconductor memory device having row and column redundancy circuit and method of manufacturing the circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·4 cites·17 claims
- 1940US6538950B2Integrated memory and corresponding operating methodINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 25, 2003·2 cites·3 claims
- 2039US7158405B2Semiconductor memory device having a plurality of memory areas with memory elementsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 2, 2007·2 cites·22 claims
- 2139US6853229B2Circuit for transforming a single ended signal into a differential mode signalINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 8, 2005·1 cites·17 claims
- 2239US6816406B2Magnetic memory configurationINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 9, 2004·2 cites·8 claims
- 2338US6657916B2Integrated memory with memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 2, 2003·2 cites·9 claims
- 2438US6459631B2Configuration for implementing redundancy for a memory chipINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 1, 2002·2 cites·5 claims
- 2536US6972989B2Reference current distribution in MRAM devicesINFINCON TECHNOLOGIES AG·Filed 2003·Granted Dec 6, 2005·1 cites·27 claims
- 2632US6429731B2CMOS voltage dividerINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 6, 2002·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →