Inventor · disambiguated record

Chan-Sub Jun

Also filed as: JUN CHAN-SUB

2 granted patents·8 citations·filing 2008–2011

49Inventor score

Technology areasG11C

Files withLEE HYONG-YONG1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0170US8036052B2Semiconductor memory device and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Oct 11, 2011·8 cites·9 claims
0229US8243540B2Semiconductor memory device and test method thereofLEE HYONG-YONG·Filed 2011·Granted Aug 14, 2012·0 cites·5 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →