Inventor · disambiguated record
Kenyu Uema
Also filed as: UEMA KENYU
2 granted patents·48 citations·filing 1978–1980
64Inventor score
Files withFUJITSU LTD2
Top patents by PatentIndex Score
2 records- 0170US4291231AElectron beam exposure system and an apparatus for carrying out the sameFUJITSU LTD·Filed 1978·Granted Sep 22, 1981·22 cites·8 claims
- 0256US4413186AMethod for detecting a position of a micro-mark on a substrate by using an electron beamFUJITSU LTD·Filed 1980·Granted Nov 1, 1983·26 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →