Inventor · disambiguated record
Gabriel L. Miller
Also filed as: MILLER GABRIEL · MILLER GABRIEL L · MILLER GABRIEL LORIMER
39 granted patents·1,937 citations·filing 1975–2012
98Inventor score
Files withAT & T BELL LAB11BELL TELEPHONE LABOR INC10APPLIED MATERIALS INC5AT & T CORP5LUCENT TECHNOLOGIES INC5
Top patents by PatentIndex Score
39 records- 0199US4526043AConformable tactile sensorAT & T BELL LAB·Filed 1983·Granted Jul 2, 1985·285 cites·5 claims
- 0297US5337353ACapacitive proximity sensorsAT & T BELL LAB·Filed 1992·Granted Aug 9, 1994·134 cites·8 claims
- 0397US5245796ASlurry polisher using ultrasonic agitationAT & T BELL LAB·Filed 1992·Granted Sep 21, 1993·172 cites·6 claims
- 0496US5081421AIn situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detectionAT & T BELL LAB·Filed 1990·Granted Jan 14, 1992·300 cites·46 claims
- 0596US4893071ACapacitive incremental position measurement and motion controlAMERICAN TELEPHONE & TELEGRAPH·Filed 1988·Granted Jan 9, 1990·91 cites·29 claims
- 0695US4286215AMethod and apparatus for the contactless monitoring carrier lifetime in semiconductor materialsBELL TELEPHONE LABOR INC·Filed 1979·Granted Aug 25, 1981·69 cites·9 claims
- 0793US4000458AMethod for the noncontacting measurement of the electrical conductivity of a lamellaBELL TELEPHONE LABOR INC·Filed 1975·Granted Dec 28, 1976·100 cites·5 claims
- 0892US7513818B2Polishing endpoint detection system and method using friction sensorAPPLIED MATERIALS INC·Filed 2004·Granted Apr 7, 2009·41 cites·24 claims
- 0992US5323053ASemiconductor devices using epitaxial silicides on (111) surfaces etched in (100) silicon substratesAT & T BELL LAB·Filed 1993·Granted Jun 21, 1994·97 cites·8 claims
- 1089US4613279AKinetic hydro energy conversion systemRIVERSIDE ENERGY TECHN INC·Filed 1984·Granted Sep 23, 1986·132 cites·11 claims
- 1186US4958115ACapacitively commutated brushless DC servomotorsAT & T BELL LAB·Filed 1988·Granted Sep 18, 1990·55 cites·36 claims
- 1284US8342906B2Friction sensor for polishing systemAPPLIED MATERIALS INC·Filed 2009·Granted Jan 1, 2013·6 cites·25 claims
- 1383US5307693AForce-sensing system, including a magnetically mounted rocking elementAT & T BELL LAB·Filed 1993·Granted May 3, 1994·48 cites·8 claims
- 1482US4190799ANoncontacting measurement of hall effect in a waferBELL TELEPHONE LABOR INC·Filed 1978·Granted Feb 26, 1980·28 cites·13 claims
- 1581US4240843AForming self-guarded p-n junctions by epitaxial regrowth of amorphous regions using selective radiation annealingBELL TELEPHONE LABOR INC·Filed 1978·Granted Dec 23, 1980·36 cites·5 claims
- 1680US8758086B2Friction sensor for polishing systemAPPLIED MATERIALS INC·Filed 2012·Granted Jun 24, 2014·2 cites·22 claims
- 1778US7112961B2Method and apparatus for dynamically measuring the thickness of an objectAPPLIED MATERIALS INC·Filed 2003·Granted Sep 26, 2006·18 cites·45 claims
- 1873US4208624AMethod and apparatus for investigating dielectric semiconductor materialsBELL TELEPHONE LABOR INC·Filed 1978·Granted Jun 17, 1980·20 cites·10 claims
- 1972US5085070ACapacitive force-balance system for measuring small forces and pressuresAT & T BELL LAB·Filed 1990·Granted Feb 4, 1992·31 cites·10 claims
- 2068US4829172AOptical ranging by phase shift measurement with return signal level compensationAMERICAN TELEPHONE & TELEGRAPH·Filed 1987·Granted May 9, 1989·27 cites·10 claims
- 2166US4107721APhototransistorBELL TELEPHONE LABOR INC·Filed 1977·Granted Aug 15, 1978·26 cites·4 claims
- 2264US4227147AElectromechanical parametric amplifier for measurement of electric fieldsBELL TELEPHONE LABOR INC·Filed 1978·Granted Oct 7, 1980·15 cites·12 claims
- 2363US7777483B2Method and apparatus for measuring a thickness of a layer of a waferAPPLIED MATERIALS INC·Filed 2008·Granted Aug 17, 2010·3 cites·19 claims
- 2458US5701133ACascaded multiplying current mirror driver for LED'sLUCENT TECHNOLOGIES INC·Filed 1994·Granted Dec 23, 1997·26 cites·9 claims
- 2558US4203781ALaser deformation of semiconductor junctionsBELL TELEPHONE LABOR INC·Filed 1978·Granted May 20, 1980·15 cites·15 claims
- 2656US5072179AHigh resolution one and two dimensional position indicating apparatus with plural windings having a common connection and separately energized by signals of different phaseAT & T BELL LAB·Filed 1990·Granted Dec 10, 1991·15 cites·7 claims
- 2754US5481104APhotodetector circuit with actively damped tuned inputAT & T CORP·Filed 1994·Granted Jan 2, 1996·22 cites·10 claims
- 2853US4551674ANoncontacting conductivity type determination and surface state spectroscopy of semiconductor materialsAT & T BELL LAB·Filed 1982·Granted Nov 5, 1985·17 cites·15 claims
- 2952US5862239ADirectional capacitor microphone systemLUCENT TECHNOLOGIES INC·Filed 1997·Granted Jan 19, 1999·23 cites·25 claims
- 3052US5756887AMechanism for changing a probe balance beam in a scanning probe microscopeLUCENT TECHNOLOGIES INC·Filed 1997·Granted May 26, 1998·18 cites·6 claims
- 3151US4597068AAcoustic ranging systemAT & T BELL LAB·Filed 1983·Granted Jun 24, 1986·12 cites·12 claims
- 3247US5480529AApparatus for depositing low stress filmsAT & T CORP·Filed 1994·Granted Jan 2, 1996·7 cites·4 claims
- 3345US4003008AElectromagnetic signal processorBELL TELEPHONE LABOR INC·Filed 1975·Granted Jan 11, 1977·5 cites·11 claims
- 3444US5444777ABattery feed for telephone line cardsAT & T CORP·Filed 1993·Granted Aug 22, 1995·13 cites·12 claims
- 3544US5382340AProcess for reduced stress tungsten depositionAT & T CORP·Filed 1993·Granted Jan 17, 1995·8 cites·9 claims
- 3643US4213087AMethod and device for testing electrical conductor elementsBELL TELEPHONE LABOR INC·Filed 1978·Granted Jul 15, 1980·8 cites·17 claims
- 3741US5744965ASystem for continuously monitoring the integrity of an electrical contact connectionLUCENT TECHNOLOGIES INC·Filed 1996·Granted Apr 28, 1998·9 cites·18 claims
- 3832US5620573AReduced stress tungsten depositionLUCENT TECHNOLOGIES INC·Filed 1995·Granted Apr 15, 1997·2 cites·7 claims
- 3931US5517012AOptical scannerAT & T CORP·Filed 1994·Granted May 14, 1996·1 cites·15 claims
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