Inventor · disambiguated record
Chau-Shiong Chen
Also filed as: CHEN CHAU-SHIONG · CHEN CHAU-SHIONG A
4 granted patents·181 citations·filing 1977–1989
80Inventor score
Top patents by PatentIndex Score
4 records- 0194US5047711AWafer-level burn-in testing of integrated circuitsSILICON CONNECTIONS CORP·Filed 1989·Granted Sep 10, 1991·134 cites·9 claims
- 0250US4876216ASemiconductor integrated circuit manufacturing process providing oxide-filled trench isolation of circuit devicesAPPLIED MICRO CIRCUITS CORP·Filed 1988·Granted Oct 24, 1989·18 cites·5 claims
- 0348US4111726ABipolar integrated circuit process by separately forming active and inactive base regionsBURROUGHS CORP·Filed 1977·Granted Sep 5, 1978·13 cites·5 claims
- 0442US4389255AMethod of forming buried collector for bipolar transistor in a semiconductor by selective implantation of poly-si followed by oxidation and etch-offBURROUGHS CORP·Filed 1980·Granted Jun 21, 1983·16 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →