Inventor · disambiguated record
Kenjirou Yamamoto
Also filed as: YAMAMOTO KENJIROU
1 granted patent·2 pending applications·5 citations·filing 2003–2005
29Inventor score
Technology areasH01J
Files withHITACHI HIGH TECH CORP1
Top patents by PatentIndex Score
3 records- 0180US7271385B2Inspection method and inspection apparatus using electron beamHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 18, 2007·5 cites·5 claims
- 0242US2005040331A1Inspection method and inspection apparatus using electron beamFiled 2004·Application pending·0 cites
- 0340US2004026633A1Inspection method and inspection apparatus using electron beamFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →