Inventor · disambiguated record
Suguru Sasaki
Also filed as: SASAKI SUGURU
15 granted patents·4 pending applications·42 citations·filing 2003–2021
89Inventor score
Files withOKI ELECTRIC IND CO LTD7SASAKI SUGURU3NEC ELECTRONICS CORP2PHC HOLDINGS CORP2RENESAS ELECTRONICS CORP2
Top patents by PatentIndex Score
19 records- 0176US9263777B2Semiconductor device, battery pack, and electronic deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Feb 16, 2016·6 cites·13 claims
- 0275US8310068B2TCP-type semiconductor deviceSASAKI SUGURU·Filed 2010·Granted Nov 13, 2012·5 cites·18 claims
- 0371US6989333B2Process for forming a patternOKI ELECTRIC IND CO LTD·Filed 2003·Granted Jan 24, 2006·14 cites·12 claims
- 0466US11635405B2Method for measuring components of biological samplePHC HOLDINGS CORP·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 0565US7459243B2Method of correcting mask patternOKI ELECTRIC IND CO LTD·Filed 2004·Granted Dec 2, 2008·8 cites·4 claims
- 0659US12080858B2Structure for battery analysis and X-ray diffraction deviceRIGAKU DENKI CO LTD·Filed 2020·Granted Sep 3, 2024·0 cites·18 claims
- 0758US10996186B2Method for measuring components of biological samplePHC HOLDINGS CORP·Filed 2017·Granted May 4, 2021·0 cites·6 claims
- 0857US7180199B2Semiconductor device and semiconductor waferOKI ELECTRIC IND CO LTD·Filed 2006·Granted Feb 20, 2007·1 cites·9 claims
- 0956US11176918B2Piezoelectric element and musical instrumentYUPO CORP·Filed 2017·Granted Nov 16, 2021·0 cites·5 claims
- 1056US8138777B2TCP-type semiconductor device and method of testing thereofSASAKI SUGURU·Filed 2009·Granted Mar 20, 2012·1 cites·20 claims
- 1152US6999160B2Optimization method of aperture type of projection alignerOKI ELECTRIC IND CO LTD·Filed 2003·Granted Feb 14, 2006·3 cites·4 claims
- 1248US8890561B2TCP-type semiconductor device and method of testing thereofSASAKI SUGURU·Filed 2012·Granted Nov 18, 2014·0 cites·19 claims
- 1343US7345498B2Method and measurement program for burn-in test of two semiconductor devices simultaneouslyNEC ELECTRONICS CORP·Filed 2005·Granted Mar 18, 2008·0 cites·10 claims
- 1443US2007176305A1Alignment mark and overlay inspection markOKI ELECTRIC IND CO LTD·Filed 2006·Application pending·0 cites
- 1541US2006183293A1Method of forming alignment mark and method of manufacturing semiconductor deviceOKI ELECTRIC IND CO LTD·Filed 2006·Application pending·0 cites
- 1640USD750783SX-ray residual stress measuring instrumentRIGAKU DENKI CO LTD·Filed 2014·Granted Mar 1, 2016·4 cites·1 claims
- 1740US7312019B2Linear grating formation methodOKI ELECTRIC IND CO LTD·Filed 2005·Granted Dec 25, 2007·0 cites·10 claims
- 1836US2010224874A1TCP-type semiconductor deviceNEC ELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 1936US2011049514A1Tcp type semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Suguru Sasaki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →