Inventor · disambiguated record
Christian Eggeling
Also filed as: EGGELING CHRISTIAN
9 granted patents·7 pending applications·111 citations·filing 2001–2013
88Inventor score
Top patents by PatentIndex Score
16 records- 0191US8580579B2Hydrophilic and lipophilic rhodamines for labelling and imagingHELL STEFAN·Filed 2010·Granted Nov 12, 2013·24 cites·13 claims
- 0290US8174692B2High spatial resolution imaging of a structure of interest in a specimenHELL STEFAN W·Filed 2010·Granted May 8, 2012·19 cites·20 claims
- 0389US8084754B2High spatial resolution imaging of a structure of interest in a specimenHELL STEFAN·Filed 2011·Granted Dec 27, 2011·21 cites·40 claims
- 0488US9551658B2STED microscopy with pulsed excitation, continuous stimulation, and gated registration of spontaneously emitted fluorescence lightMAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WSS E V·Filed 2013·Granted Jan 24, 2017·10 cites·45 claims
- 0588US8735444B2Fluorinated rhodamines as photostable fluorescent dyes for labelling and imaging techniquesHELL STEFAN W·Filed 2009·Granted May 27, 2014·17 cites·4 claims
- 0683US7719679B2Method and device for optically measuring a sampleMAX PLANCK GESELLSCHAFT·Filed 2007·Granted May 18, 2010·10 cites·30 claims
- 0780US7880150B2High spatial resolution imaging of a structure of interest in a specimenMAX PLANCK GESELLSCHAFT·Filed 2008·Granted Feb 1, 2011·7 cites·38 claims
- 0855US9759659B2Method for detecting the impacts of interfering effects on experimental dataEGGELING CHRISTIAN·Filed 2011·Granted Sep 12, 2017·1 cites·4 claims
- 0954US7345759B2Method and device for the measurement of chemical and/or biological samplesEVOTEC AG·Filed 2001·Granted Mar 18, 2008·2 cites·38 claims
- 1050US2007085025A1Method for characterizing samples of secondary light emitting particlesMAX PLANCK GESELLSCHAFT·Filed 2006·Application pending·0 cites
- 1148US2008270073A1Method for detecting the impacts of interfering effects on experimental dataEVOTEC AG·Filed 2008·Application pending·0 cites
- 1243US2010211328A1Method for detecting the impacts of interfering effects on experimental dataEVOTEC AG·Filed 2010·Application pending·0 cites
- 1341US2004099813A1Method for characterizing samples of secondary light emitting particlesFiled 2001·Application pending·0 cites
- 1439US2007047287A1Method and apparatus for storing a three-dimensional arrangement of data bits in a solid-state bodyMAX PLANCK GESELLCHAFT ZUR FOR·Filed 2006·Application pending·0 cites
- 1536US2004174821A1Method for detecting the impacts of interfering effects on experimental dataFiled 2003·Application pending·0 cites
- 1634US2010140506A1Method of determining a measurement value on the basis of single molecule eventsMAX PLANCK GESELLSCHAFT·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →