Inventor · disambiguated record

Anna Prokhodtseva

Also filed as: PROKHODTSEVA ANNA

2 granted patents·7 citations·filing 2017–2018

52Inventor score

Technology areasH01J

Files withFEI CO2

Top patents by PatentIndex Score

2 records

0181US10784076B23D defect characterization of crystalline samples in a scanning type electron microscopeFEI CO·Filed 2018·Granted Sep 22, 2020·4 cites·19 claims
0276US10504689B2Method for sample orientation for TEM lamella preparationFEI CO·Filed 2017·Granted Dec 10, 2019·3 cites·20 claims

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