Inventor · disambiguated record
Yuki Hirohashi
Also filed as: HIROHASHI YUKI
6 granted patents·4 pending applications·6 citations·filing 2017–2022
69Inventor score
Files withOMRON TATEISI ELECTRONICS CO10
Top patents by PatentIndex Score
10 records- 0178US11163277B2Abnormality detection system, support device, and model generation methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Nov 2, 2021·4 cites·15 claims
- 0269US11106197B2Prediction model creation apparatus, production facility monitoring system, and production facility monitoring methodOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Aug 31, 2021·2 cites·20 claims
- 0354US12307773B2Information management device and information management method for classifying event occurred in equipment and generating maintenance informationOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted May 20, 2025·0 cites·14 claims
- 0451US10913564B2Packaging machine, control apparatus for packaging machine, control method, and programOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Feb 9, 2021·0 cites·13 claims
- 0549US2024311690A1Data generation device, data generation method, and programOMRON TATEISI ELECTRONICS CO·Filed 2022·Application pending·0 cites
- 0648US10890888B2Control apparatus, control program, control system, and control methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Jan 12, 2021·0 cites·10 claims
- 0744US2024232704A9Machine learning data generation method, meta-learning method, machine learning data generation apparatus, and programOMRON TATEISI ELECTRONICS CO·Filed 2022·Application pending·0 cites
- 0841US12060231B2Measurement control device, packaging device and measurement control methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Granted Aug 13, 2024·0 cites·8 claims
- 0940US2018348728A1Process analysis apparatus, process analysis method, and process analysis programOMRON TATEISI ELECTRONICS CO·Filed 2018·Application pending·0 cites
- 1038US2021253289A1Measurement control device, packaging device and measurement control methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →