Inventor · disambiguated record
Georg Farkas
Also filed as: FARKAS GEORG
3 granted patents·15 citations·filing 2001–2002
60Inventor score
Top patents by PatentIndex Score
3 records- 0159US6876591B2Integrated circuit with self-test device for an embedded non-volatile memory and related test methodKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 5, 2005·14 cites·10 claims
- 0236US7493542B2Arrangement for testing integrated circuitsNXP BV·Filed 2001·Granted Feb 17, 2009·1 cites·11 claims
- 0327US7664998B2Non-volatile memory and accelerated test method for address decoder by added modified dummy memory cellsNXP BV·Filed 2002·Granted Feb 16, 2010·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →