Inventor · disambiguated record
Vamsi Velidandla
Also filed as: VELIDANDLA VAMSI · VELIDANDLA VAMSI M · VELIDANDLA VAMSI MOHAN
13 granted patents·116 citations·filing 2004–2015
91Inventor score
Files withKLA TENCOR TECH CORP6KLA TENCOR CORP3ZETA INSTR INC2KLA TENCOR TECHNOLOGUES CORP1LEE KEN KINSUN1
Top patents by PatentIndex Score
13 records- 0191US7161669B2Wafer edge inspectionKLA TENCOR TECH CORP·Filed 2006·Granted Jan 9, 2007·18 cites·26 claims
- 0290US7592616B1Detecting micropipesKLA TENCOR CORP·Filed 2006·Granted Sep 22, 2009·9 cites·13 claims
- 0387US7397621B2Servo pattern characterization on magnetic disksKLA TENCOR TECH CORP·Filed 2006·Granted Jul 8, 2008·8 cites·17 claims
- 0486US7532318B2Wafer edge inspectionKLA TENCOR CORP·Filed 2006·Granted May 12, 2009·10 cites·29 claims
- 0582US7630086B2Surface finish roughness measurementKLA TENCOR CORP·Filed 2007·Granted Dec 8, 2009·17 cites·16 claims
- 0682US7396022B1System and method for optimizing wafer flatness at high rotational speedsKLA TENCOR TECH CORP·Filed 2004·Granted Jul 8, 2008·32 cites·24 claims
- 0776US7201799B1System and method for classifying, detecting, and counting micropipesKLA TENCOR TECH CORP·Filed 2004·Granted Apr 10, 2007·11 cites·22 claims
- 0875US9036869B2Multi-surface optical 3D microscopeLEE KEN KINSUN·Filed 2011·Granted May 19, 2015·4 cites·19 claims
- 0967US7295300B1Detecting surface pitsKLA TENCOR TECH CORP·Filed 2005·Granted Nov 13, 2007·3 cites·20 claims
- 1056US7075741B1System and method for automatically determining magnetic eccentricity of a diskKLA TENCOR TECHNOLOGUES CORP·Filed 2004·Granted Jul 11, 2006·4 cites·10 claims
- 1151US9664888B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 30, 2017·0 cites·20 claims
- 1250US9645381B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 9, 2017·0 cites·11 claims
- 1342US7355711B2Method for detecting an end-point for polishing a materialKLA TENCOR TECH CORP·Filed 2005·Granted Apr 8, 2008·0 cites·14 claims
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