Inventor · disambiguated record
Yoshiharu Umemura
Also filed as: UMEMURA YOSHIHARU
12 granted patents·58 citations·filing 1977–2010
89Inventor score
Top patents by PatentIndex Score
12 records- 0192US8513962B2Wafer tray and test apparatusKIYOKAWA TOSHIYUKI·Filed 2010·Granted Aug 20, 2013·16 cites·13 claims
- 0290US8289040B2Test wafer unit and test systemKOMOTO YOSHIO·Filed 2010·Granted Oct 16, 2012·11 cites·22 claims
- 0375US8410807B2Test system and probe apparatusUMEMURA YOSHIHARU·Filed 2010·Granted Apr 2, 2013·4 cites·12 claims
- 0470US8134379B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Mar 13, 2012·3 cites·10 claims
- 0563US8779791B2Method of manufacturing probe having boards connected by magnetsUMEMURA YOSHIHARU·Filed 2010·Granted Jul 15, 2014·2 cites·6 claims
- 0658US8427187B2Probe wafer, probe device, and testing systemKOMOTO YOSHIO·Filed 2010·Granted Apr 23, 2013·1 cites·18 claims
- 0757US8598902B2Probe, electronic device test apparatus, and method of producing the sameUMEMURA YOSHIHARU·Filed 2009·Granted Dec 3, 2013·3 cites·28 claims
- 0857US7342407B2Temperature compensation circuit and testing apparatusADVANTEST CORP·Filed 2006·Granted Mar 11, 2008·3 cites·7 claims
- 0952US6774680B2Comparator including a differential transistor pair and a diode arrangementHITACHI LTD·Filed 2003·Granted Aug 10, 2004·8 cites·18 claims
- 1051US7389190B2Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatusADVANTEST CORP·Filed 2004·Granted Jun 17, 2008·5 cites·18 claims
- 1139US4144512AAFC voltage superimposing circuit for electronic tunerHITACHI LTD·Filed 1977·Granted Mar 13, 1979·2 cites·3 claims
- 1235US7208982B2Sampling circuitADVANTEST CORP·Filed 2005·Granted Apr 24, 2007·0 cites·6 claims
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