Inventor · disambiguated record
Toshiyuki Kiyokawa
Also filed as: KIYOKAWA TOSHIYUKI
29 granted patents·5 pending applications·693 citations·filing 1991–2024
97Inventor score
Top patents by PatentIndex Score
34 records- 0195US11579187B1Test carrier and electronic component testing apparatusADVANTEST CORP·Filed 2022·Granted Feb 14, 2023·2 cites·16 claims
- 0295US5172049AIC test equipmentADVANTEST CORP·Filed 1991·Granted Dec 15, 1992·175 cites·5 claims
- 0394US12174248B2Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test systemADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 24, 2024·5 cites·20 claims
- 0492US8513962B2Wafer tray and test apparatusKIYOKAWA TOSHIYUKI·Filed 2010·Granted Aug 20, 2013·16 cites·13 claims
- 0591US8493083B2Test apparatus, test method and computer readable mediumKIYOKAWA TOSHIYUKI·Filed 2010·Granted Jul 23, 2013·11 cites·8 claims
- 0690US6445203B1Electric device testing apparatusADVANTEST CORP·Filed 1999·Granted Sep 3, 2002·103 cites·22 claims
- 0788US8299935B2Test apparatus and test methodKIYOKAWA TOSHIYUKI·Filed 2010·Granted Oct 30, 2012·23 cites·20 claims
- 0887US11808812B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 7, 2023·1 cites·20 claims
- 0987US6456062B2Contact arm and electronic device testing apparatus using the sameADVANTEST CORP·Filed 2001·Granted Sep 24, 2002·34 cites·8 claims
- 1086US6590383B2Contact arm and electronic device testing apparatus using the sameADVANTEST CORP·Filed 2002·Granted Jul 8, 2003·30 cites·17 claims
- 1185US6313653B1IC chip tester with heating element for preventing condensationADVANTEST CORP·Filed 1999·Granted Nov 6, 2001·56 cites·7 claims
- 1281US12320852B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 1375US12372549B2Test carrier and carrier assembling apparatusADVANTEST CORP·Filed 2021·Granted Jul 29, 2025·0 cites·5 claims
- 1475US12276676B2Test carrier and carrier assembling apparatusADVANTEST CORP·Filed 2021·Granted Apr 15, 2025·0 cites·7 claims
- 1575US12140610B2Test carrier and carrier assembling apparatusADVANTEST CORP·Filed 2021·Granted Nov 12, 2024·0 cites·1 claims
- 1675US11906548B2Test carrier and carrier assembling apparatusADVANTEST CORP·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 1773US9588142B2Electronic device handling apparatus and electronic device testing apparatusADVANTEST CORP·Filed 2014·Granted Mar 7, 2017·4 cites·6 claims
- 1872US6019564ASemiconductor device transporting and handling apparatusADVANTEST CORP·Filed 1996·Granted Feb 1, 2000·45 cites·23 claims
- 1971US11693026B2Test carrierADVANTEST CORP·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
- 2071US5742168ATest section for use in an IC handlerADVANTEST CORP·Filed 1996·Granted Apr 21, 1998·42 cites·4 claims
- 2170US9121901B2Semiconductor wafer test apparatusKIYOKAWA TOSHIYUKI·Filed 2009·Granted Sep 1, 2015·3 cites·11 claims
- 2267US5812409ASemiconductor device transport system with deformed tray compensationADVANTEST CORP·Filed 1997·Granted Sep 22, 1998·29 cites·11 claims
- 2366US11531043B2Test carrier and carrier assembling apparatusADVANTEST CORP·Filed 2019·Granted Dec 20, 2022·0 cites·10 claims
- 2466US6218849B1Device for detecting proper mounting of an IC for testing in an IC testing apparatusADVANTEST CORP·Filed 1998·Granted Apr 17, 2001·27 cites·16 claims
- 2564US5177435AIC test equipmentADVANTEST CORP·Filed 1991·Granted Jan 5, 1993·25 cites·5 claims
- 2662US5920192AIntegrated circuit transporting apparatus including a guide with an integrated circuit positioning functionADVANTEST CORP·Filed 1996·Granted Jul 6, 1999·28 cites·23 claims
- 2761US2025076367A1Semiconductor wafer handling apparatus and semiconductor wafer testing systemADVANTEST CORP·Filed 2024·Application pending·0 cites
- 2861US2025076366A1Semiconductor wafer handling apparatus and semiconductor wafer testing systemADVANTEST CORP·Filed 2024·Application pending·0 cites
- 2960US5722514ATray installation rack for test handlerADVANTEST CORP·Filed 1996·Granted Mar 3, 1998·25 cites·9 claims
- 3057US7298156B2Electronic part test apparatusADVANTEST CORP·Filed 2002·Granted Nov 20, 2007·6 cites·28 claims
- 3142US2003122566A1IC chip tester with heating element for preventing condensationADVANTEST CORP·Filed 2002·Application pending·0 cites
- 3241US2002011863A1IC chip tester with heating element for preventing condensationADVANTEST CORP·Filed 2001·Application pending·0 cites
- 3339US2007159532A1Image sensor test apparatusADVANTEST CORP·Filed 2004·Application pending·0 cites
- 3438USD442568SIC module insertADVANTEST CORP·Filed 2000·Granted May 22, 2001·3 cites·1 claims
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