Inventor · disambiguated record
Tony Mule
Also filed as: MULE TONY · MULE TONY V
8 granted patents·2 pending applications·368 citations·filing 2002–2006
88Inventor score
Top patents by PatentIndex Score
10 records- 0198US7016569B2Back-side-of-die, through-wafer guided-wave optical clock distribution networks, method of fabrication thereof, and uses thereofGEORGIA TECH RES INST·Filed 2003·Granted Mar 21, 2006·295 cites·39 claims
- 0281US6788867B2Backplane, printed wiring board, and/or multi-chip module-level optical interconnect layer having embedded air-gap technologies and methods of fabricationGEORGIA TECH RES INST·Filed 2003·Granted Sep 7, 2004·21 cites·19 claims
- 0380US6785458B2Guided-wave optical interconnections embedded within a microelectronic wafer-level batch packageGEORGIA TECH RES INST·Filed 2002·Granted Aug 31, 2004·19 cites·13 claims
- 0474US6807352B2Optical waveguides with embedded air-gap cladding layer and methods of fabrication thereofGEORGIA TECH RES INST·Filed 2002·Granted Oct 19, 2004·15 cites·15 claims
- 0569US6954576B2Guided-wave optical interconnections embedded within a microelectronic wafer-level batch packageGEORGIA TECH RES INST·Filed 2004·Granted Oct 11, 2005·9 cites·10 claims
- 0655US6947651B2Optical waveguides formed from nano air-gap inter-layer dielectric materials and methods of fabrication thereofGEORGIA TECH RES INST·Filed 2002·Granted Sep 20, 2005·5 cites·13 claims
- 0750US7554347B2High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of useGEORGIA TECH RES INST·Filed 2003·Granted Jun 30, 2009·4 cites·28 claims
- 0840US7649264B2Hard mask for low-k interlayer dielectric patterningINTEL CORP·Filed 2006·Granted Jan 19, 2010·0 cites·5 claims
- 0937US2005257709A1Systems and methods for three-dimensional lithography and nano-indentationMULE TONY·Filed 2003·Application pending·0 cites
- 1034US2007059913A1Capping layer to reduce amine poisoning of photoresist layersKING SEAN W·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →