Inventor · disambiguated record
Gwang-Hyeon Baek
Also filed as: BAEK GWANG-HYEON
2 granted patents·1 pending application·9 citations·filing 2006–2007
47Inventor score
Technology areasG06F
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0170US7802210B2Methods and systems for analyzing layouts of semiconductor integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 21, 2010·9 cites·7 claims
- 0238US7703055B2Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of holeSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 20, 2010·0 cites·20 claims
- 0338US2007118824A1Methods, systems, and computer program products for improving yield in integrated circuit device fabrication and related devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →