Inventor · disambiguated record
Jonathan Edmund Ludlow
Also filed as: LUDLOW JONATHAN · LUDLOW JONATHAN E · LUDLOW JONATHAN EDMUND
11 granted patents·646 citations·filing 1981–2001
94Inventor score
Top patents by PatentIndex Score
11 records- 0194US6144453ASystem and method for three-dimensional inspection using patterned light projectionACUITY IMAGING LLC·Filed 1999·Granted Nov 7, 2000·129 cites·7 claims
- 0290US4776068AQuiet touch fastener materialVELCRO IND·Filed 1986·Granted Oct 11, 1988·64 cites·14 claims
- 0384US5828449ARing illumination reflective elements on a generally planar surfaceACUITY IMAGING LLC·Filed 1997·Granted Oct 27, 1998·71 cites·27 claims
- 0483US7075662B2Method for three-dimensional inspection using patterned light projectionSIEMENS ENERGY & AUTOMATION·Filed 2001·Granted Jul 11, 2006·19 cites·19 claims
- 0583US5943125ARing illumination apparatus for illuminating reflective elements on a generally planar surfaceACUITY IMAGING LLC·Filed 1997·Granted Aug 24, 1999·74 cites·31 claims
- 0682US6169600B1Cylindrical object surface inspection systemACUITY IMAGING LLC·Filed 1998·Granted Jan 2, 2001·75 cites·22 claims
- 0778US6262803B1System and method for three-dimensional inspection using patterned light projectionACUITY IMAGING LLC·Filed 1998·Granted Jul 17, 2001·42 cites·33 claims
- 0871US6201892B1System and method for arithmetic operations for electronic package inspectionACUITY IMAGING LLC·Filed 1998·Granted Mar 13, 2001·85 cites·17 claims
- 0970US6236747B1System and method for image subtraction for ball and bumped grid array inspectionACUITY IMAGING LLC·Filed 1998·Granted May 22, 2001·47 cites·17 claims
- 1066US6118524AArc illumination apparatus and methodACUITY IMAGING LLC·Filed 1999·Granted Sep 12, 2000·27 cites·35 claims
- 1143US4382633ALongwall mining systemFOSTER MILLER ASS·Filed 1981·Granted May 10, 1983·13 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →