Inventor · disambiguated record
Tae-Heung Ahn
Also filed as: AHN TAE-HEUNG
4 granted patents·2 pending applications·6 citations·filing 2015–2020
62Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0187US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0277US11029256B2Apparatus for measuring waferSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 0340US10473579B2Apparatus for inspecting material property of plurality of measurement objectsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 12, 2019·0 cites·14 claims
- 0439US10733719B2Wafer inspection apparatus and wafer inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 4, 2020·0 cites·3 claims
- 0535US2019094072A1Atomic emission spectrometer based on laser-induced plasma (lip), semiconductor manufacturing facility including the atomic emission spectrometer, and method of manufacturing semiconductor device using the atomic emission spectrometerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 0634US2018164227A1Substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →