Inventor · disambiguated record

Migaku Oda

Also filed as: ODA MIGAKU

1 granted patent·5 citations·filing 2005–2005

27Inventor score

Technology areasG01Q

Files withJAPAN SCIENCE & TECH AGENCY1

Top patents by PatentIndex Score

1 record

0162US7553335B2Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometerJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Jun 30, 2009·5 cites·2 claims

Join the waitlist — get patent alerts

Get an alert when Migaku Oda files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →

Migaku Oda — Patent Inventor | PatentIndex