Inventor · disambiguated record
Yasushi Ebizuka
Also filed as: EBIZUKA YASUSHI
12 granted patents·1 pending application·19 citations·filing 2011–2022
85Inventor score
Top patents by PatentIndex Score
13 records- 0186US10832886B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 10, 2020·3 cites·11 claims
- 0285US11056310B2Charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 6, 2021·4 cites·10 claims
- 0384US9401297B2Electrostatic chuck mechanism and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 26, 2016·5 cites·10 claims
- 0472US9543113B2Charged-particle beam device for irradiating a charged particle beam on a sampleHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 10, 2017·2 cites·6 claims
- 0571US11784023B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 10, 2023·0 cites·5 claims
- 0670US11791124B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 17, 2023·0 cites·3 claims
- 0770US9105446B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 11, 2015·2 cites·5 claims
- 0869US11239042B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·5 claims
- 0962US8933422B2Charged particle beam deviceISHII RYOICHI·Filed 2011·Granted Jan 13, 2015·2 cites·5 claims
- 1062US2020294757A1Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 1158US12211194B2Defect inspection with images of different synthesis ratiosHITACHI HIGH TECH CORP·Filed 2022·Granted Jan 28, 2025·0 cites·10 claims
- 1252US9245710B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 26, 2016·1 cites·5 claims
- 1340US9799486B2Charged particle beam apparatus for measuring surface potential of a sampleHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 24, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →