Inventor · disambiguated record
Abraham Yoo
Also filed as: YOO ABRAHAM
11 granted patents·4 pending applications·22 citations·filing 2006–2024
83Inventor score
Top patents by PatentIndex Score
15 records- 0187US12328904B2Semiconductor structure and forming method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2022·Granted Jun 10, 2025·1 cites·10 claims
- 0285US7781282B2Shared contact structure, semiconductor device and method of fabricating the semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 24, 2010·13 cites·8 claims
- 0380US8114730B2Shared contact structure, semiconductor device and method of fabricating the semiconductor deviceYOO ABRAHAM·Filed 2010·Granted Feb 14, 2012·7 cites·10 claims
- 0473US2025015081A1Fabrication method of semiconductor structureSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2024·Application pending·0 cites
- 0571US9911809B2Semiconductor device having impurity regionSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 6, 2018·1 cites·20 claims
- 0667US12376328B2Semiconductor structure and forming method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2023·Granted Jul 29, 2025·0 cites·6 claims
- 0760US11626497B2Semiconductor structure and forming method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Apr 11, 2023·0 cites·12 claims
- 0858US2022028855A1Semiconductor structure and fabrication method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Application pending·0 cites
- 0956US10164017B2Method of forming a semiconductor device having impurity regionSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 25, 2018·0 cites·20 claims
- 1052US11809802B2Process manufacturing method, method for adjusting threshold voltage device, and storage mediumSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Nov 7, 2023·0 cites·26 claims
- 1149US11631743B2Semiconductor structure and forming method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Apr 18, 2023·0 cites·16 claims
- 1249US2023369328A1Semiconductor structure and method for forming sameSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2023·Application pending·0 cites
- 1349US2024313078A1Semiconductor structure and fabrication method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Application pending·0 cites
- 1448US12080596B2Semiconductor structure and forming method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Sep 3, 2024·0 cites·12 claims
- 1548US11769691B2Semiconductor device and formation method thereofSEMICONDUCTOR MFG INT SHANGHAI CORP·Filed 2021·Granted Sep 26, 2023·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →