Inventor · disambiguated record
Liu Di Wang
Also filed as: WANG LIU · WANG LIU DI
3 granted patents·2 citations·filing 2015–2017
52Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0176US10345375B2Test method and test apparatus for testing a plurality of blocks in a circuitIBM·Filed 2017·Granted Jul 9, 2019·2 cites·17 claims
- 0247US9664741B2Test method and test apparatus for testing a plurality of blocks in a circuitIBM·Filed 2015·Granted May 30, 2017·0 cites·11 claims
- 0341US10831751B2Query parallelism methodIBM·Filed 2016·Granted Nov 10, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →