Inventor · disambiguated record
Walter H. Johnson
Also filed as: JOHNSON III WALTER H · JOHNSON III WALTER HALMER · JOHNSON WALTER · JOHNSON WALTER H
20 granted patents·1 pending application·715 citations·filing 1992–2021
95Inventor score
Files withKLA TENCOR CORP11KLA CORP2KLA TENCOR TECH CORP2HUMAN AUTOMATION TEAMING SOLUTIONS INC1INERTIAL SENSE INC1
Top patents by PatentIndex Score
21 records- 0199US6433541B1In-situ metalization monitoring using eddy current measurements during the process for removing the filmKLA TENCOR CORP·Filed 2000·Granted Aug 13, 2002·161 cites·21 claims
- 0298US6707540B1In-situ metalization monitoring using eddy current and optical measurementsKLA TENCOR CORP·Filed 2000·Granted Mar 16, 2004·162 cites·38 claims
- 0396US6621264B1In-situ metalization monitoring using eddy current measurements during the process for removing the filmKLA TENCOR CORP·Filed 2002·Granted Sep 16, 2003·72 cites·15 claims
- 0493US7302316B2Programmable autopilot system for autonomous flight of unmanned aerial vehiclesUNIV BRIGHAM YOUNG·Filed 2004·Granted Nov 27, 2007·155 cites·21 claims
- 0593US7070476B2In-situ metalization monitoring using eddy current measurements during the process for removing the filmKLA TENCOR CORP·Filed 2005·Granted Jul 4, 2006·17 cites·3 claims
- 0680US9778043B1Aided INS microchip assemblies and related methodsINERTIAL SENSE LLC·Filed 2016·Granted Oct 3, 2017·5 cites·18 claims
- 0779US6885190B2In-situ metalization monitoring using eddy current measurements during the process for removing the filmKLA TENCOR CORP·Filed 2003·Granted Apr 26, 2005·11 cites·2 claims
- 0876US11043239B2Magneto-optic Kerr effect metrology systemsKLA CORP·Filed 2020·Granted Jun 22, 2021·1 cites·10 claims
- 0975US5260668ASemiconductor surface resistivity probe with semiconductor temperature controlPROMETRIX CORP·Filed 1992·Granted Nov 9, 1993·46 cites·9 claims
- 1074US5552704AEddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curvesTENCOR INSTRUMENTS·Filed 1993·Granted Sep 3, 1996·56 cites·30 claims
- 1172US10514391B2Resistivity probe having movable needle bodiesKLA TENCOR CORP·Filed 2017·Granted Dec 24, 2019·1 cites·8 claims
- 1269US7050160B1Process and apparatus for integrating sheet resistance measurements and reflectance measurements of a thin film in a common apparatusKLA TENCOR TECH CORP·Filed 2003·Granted May 23, 2006·8 cites·24 claims
- 1368US10231337B2Folded printed circuit assemblies and related methodsINERTIAL SENSE INC·Filed 2015·Granted Mar 12, 2019·2 cites·11 claims
- 1465US6815959B2Systems and methods for measuring properties of conductive layersKLA TENCOR TECH CORP·Filed 2002·Granted Nov 9, 2004·18 cites·22 claims
- 1564US11249110B2Resistivity probes with curved portionsKLA TENCOR CORP·Filed 2019·Granted Feb 15, 2022·0 cites·9 claims
- 1654US12164093B2Reflective compact lens for magneto-optic Kerr effect metrology systemKLA CORP·Filed 2021·Granted Dec 10, 2024·0 cites·19 claims
- 1750US9030219B2Variable pressure four-point coated probe pin device and methodKLA TENCOR CORP·Filed 2013·Granted May 12, 2015·0 cites·19 claims
- 1844US10598477B2Dynamic determination of metal film thickness from sheet resistance and TCR valueKLA—TENCOR CORP·Filed 2017·Granted Mar 24, 2020·0 cites·6 claims
- 1941US9435826B2Variable spacing four-point probe pin device and methodKLA TENCOR CORP·Filed 2013·Granted Sep 6, 2016·0 cites·14 claims
- 2038US10663279B2Dynamic determination of metal film thickness from sheet resistance and TCR valueKLA TENCOR CORP·Filed 2017·Granted May 26, 2020·0 cites·16 claims
- 2136US2022035367A1Coordination of remote vehicles using automation level assignmentsHUMAN AUTOMATION TEAMING SOLUTIONS INC·Filed 2019·Application pending·0 cites
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