Inventor · disambiguated record
Vishwanath Bhat
Also filed as: BHAT VISHWANATH · BHAT VISHWANATH SUBRAY
69 granted patents·10 pending applications·399 citations·filing 2003–2021
99Inventor score
Files withMICRON TECHNOLOGY INC35BHAT VISHWANATH11ANTONOV VASSIL6KRISHNAN RISHIKESH4NANYA TECHNOLOGY CORP3
Top patents by PatentIndex Score
79 records- 0198US7682924B2Methods of forming a plurality of capacitorsMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 23, 2010·57 cites·40 claims
- 0297US7557013B2Methods of forming a plurality of capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 7, 2009·70 cites·45 claims
- 0394US9397143B2Liner for phase change memory (PCM) array and associated techniques and configurationsINTEL CORP·Filed 2013·Granted Jul 19, 2016·14 cites·7 claims
- 0493US10249819B2Methods of forming semiconductor structures including multi-portion linersMICRON TECHNOLOGY INC·Filed 2014·Granted Apr 2, 2019·13 cites·19 claims
- 0592US8564095B2Capacitors including a rutile titanium dioxide material and semiconductor devices incorporating sameHUANG TSAI-YU·Filed 2011·Granted Oct 22, 2013·10 cites·17 claims
- 0692US7976897B2Thermal chemical vapor deposition methods, and thermal chemical vapor deposition systemsMICRON TECHNOLOGY INC·Filed 2007·Granted Jul 12, 2011·14 cites·17 claims
- 0792US7785962B2Methods of forming a plurality of capacitorsMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 31, 2010·17 cites·40 claims
- 0889US8371781B2Seat track fittingZODIAC SEATS US LLC·Filed 2010·Granted Feb 12, 2013·14 cites·25 claims
- 0989US7902081B2Methods of etching polysilicon and methods of forming pluralities of capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 8, 2011·15 cites·51 claims
- 1087US7820506B2Capacitors, dielectric structures, and methods of forming dielectric structuresMICRON TECHNOLOGY INC·Filed 2008·Granted Oct 26, 2010·10 cites·4 claims
- 1186US8110469B2Graded dielectric layersGEALY DAN·Filed 2005·Granted Feb 7, 2012·12 cites·31 claims
- 1285US8602702B2Seat track fittingROY PHILIPPE·Filed 2012·Granted Dec 10, 2013·13 cites·20 claims
- 1385US8603877B2Methods of forming dielectric material-containing structuresROCKLEIN NOEL·Filed 2012·Granted Dec 10, 2013·6 cites·6 claims
- 1484US8940388B2Insulative elementsANTONOV VASSIL·Filed 2011·Granted Jan 27, 2015·6 cites·20 claims
- 1584US8518486B2Methods of forming and utilizing rutile-type titanium oxideMIRIN NIK·Filed 2010·Granted Aug 27, 2013·8 cites·12 claims
- 1683US10665782B2Methods of forming semiconductor structures including multi-portion linersMICRON TECHNOLOGY INC·Filed 2018·Granted May 26, 2020·2 cites·18 claims
- 1783US8760845B2Capacitor dielectric comprising silicon-doped zirconium oxide and capacitor using the sameROCKLEIN NOEL·Filed 2012·Granted Jun 24, 2014·6 cites·4 claims
- 1882US8748283B2Methods of forming capacitors and semiconductor devices including a rutile titanium dioxide materialMICRON TECHNOLOGY INC·Filed 2013·Granted Jun 10, 2014·3 cites·21 claims
- 1982US7618874B1Methods of forming capacitorsMICRON TECHNOLOGY INC·Filed 2008·Granted Nov 17, 2009·8 cites·29 claims
- 2080US8528175B2Methods of forming capacitorsANTONOV VASSIL·Filed 2011·Granted Sep 10, 2013·3 cites·10 claims
- 2179US9627501B2Graded dielectric structuresMICRON TECHNOLOGY INC·Filed 2015·Granted Apr 18, 2017·2 cites·20 claims
- 2278US8481122B2Methods of forming material over substratesCARLSON CHRIS M·Filed 2006·Granted Jul 9, 2013·4 cites·18 claims
- 2378US6855594B1Methods of forming capacitorsMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 15, 2005·16 cites·31 claims
- 2477US8861179B2Capacitors having dielectric regions that include multiple metal oxide-comprising materialsKRISHNAN RISHIKESH·Filed 2012·Granted Oct 14, 2014·2 cites·33 claims
- 2576US9466660B2Semiconductor structures including molybdenum nitride, molybdenum oxynitride or molybdenum-based alloy material, and method of making such structuresMICRON TECHNOLOGY INC·Filed 2013·Granted Oct 11, 2016·5 cites·15 claims
- 2675US8236372B2Methods of forming capacitors having dielectric regions that include multiple metal oxide-comprising materialsKRISHNAN RISHIKESH·Filed 2009·Granted Aug 7, 2012·5 cites·25 claims
- 2774US8105896B2Methods of forming capacitorsBHAT VISHWANATH·Filed 2009·Granted Jan 31, 2012·4 cites·13 claims
- 2874US7635623B2Methods of forming capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 22, 2009·4 cites·43 claims
- 2972US8609553B2Methods of forming rutile titanium dioxide and associated methods of forming semiconductor structuresHUANG TSAI-YU·Filed 2011·Granted Dec 17, 2013·2 cites·8 claims
- 3072US8497566B2Capacitors including conductive TiOxNxBHAT VISHWANATH·Filed 2011·Granted Jul 30, 2013·2 cites·21 claims
- 3171US11050020B2Methods of forming devices including multi-portion linersMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 29, 2021·0 cites·20 claims
- 3271US10879462B2Devices including multi-portion linersMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 29, 2020·0 cites·20 claims
- 3371US7056784B2Methods of forming capacitors by ALD to prevent oxidation of the lower electrodeMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 6, 2006·10 cites·31 claims
- 3469US8310807B2Capacitors having dielectric regions that include multiple metal oxide-comprising materialsKRISHNAN RISHIKESH·Filed 2009·Granted Nov 13, 2012·4 cites·32 claims
- 3568US10162735B2Distributed system test automation frameworkRED HAT INC·Filed 2016·Granted Dec 25, 2018·1 cites·20 claims
- 3668US7439564B2Methods of forming capacitor constructionsMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 21, 2008·2 cites·16 claims
- 3768US7115929B2Semiconductor constructions comprising aluminum oxide and metal oxide dielectric materialsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 3, 2006·10 cites·22 claims
- 3867US10556688B2One-motion table latchSAFRAN SEATS USA LLC·Filed 2016·Granted Feb 11, 2020·2 cites·20 claims
- 3967US8993044B2Methods of forming capacitors having dielectric regions that include multiple metal oxide-comprising materialsKRISHNAN RISHIKESH·Filed 2012·Granted Mar 31, 2015·2 cites·29 claims
- 4067US8927441B2Methods of forming rutile titanium dioxideMICRON TECHNOLOGY INC·Filed 2013·Granted Jan 6, 2015·1 cites·20 claims
- 4166US9236427B2Multi-material structures and capacitor-containing semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2014·Granted Jan 12, 2016·3 cites·15 claims
- 4266US9209013B2Constructions comprising thermally conductive stacks containing rutile-type titanium oxideMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 8, 2015·1 cites·4 claims
- 4366US8450164B2Methods of forming a plurality of capacitorsBHAT VISHWANATH·Filed 2010·Granted May 28, 2013·2 cites·26 claims
- 4466US8124528B2Method for forming a ruthenium filmBHAT VISHWANATH·Filed 2008·Granted Feb 28, 2012·2 cites·37 claims
- 4566US8012532B2Methods of making crystalline tantalum pentoxideMICRON TECHNOLOGY INC·Filed 2007·Granted Sep 6, 2011·2 cites·24 claims
- 4665US8513807B2Semiconductor devices including a ruthenium filmBHAT VISHWANATH·Filed 2012·Granted Aug 20, 2013·1 cites·25 claims
- 4764US8951903B2Graded dielectric structuresGEALY DAN·Filed 2012·Granted Feb 10, 2015·1 cites·29 claims
- 4864US8187933B2Methods of forming dielectric material-containing structuresROCKLEIN NOEL·Filed 2010·Granted May 29, 2012·1 cites·12 claims
- 4964US7759717B2Capacitors comprising dielectric regions having first and second oxide material portions of the same chemical compositon but different densitiesMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 20, 2010·1 cites·29 claims
- 5063US9159551B2Methods of forming capacitorsANTONOV VASSIL·Filed 2009·Granted Oct 13, 2015·1 cites·24 claims
Showing the top 50 of 79 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →