Inventor · disambiguated record
Yun-Bo Yang
Also filed as: YANG YUN-BO
5 granted patents·1 pending application·7 citations·filing 2006–2016
69Inventor score
Top patents by PatentIndex Score
6 records- 0178US9000789B2Method and equipment for testing semiconductor apparatuses simultaneously and continuouslyKIM EUN-SIK·Filed 2011·Granted Apr 7, 2015·5 cites·18 claims
- 0259US10338134B2Interface board, a multichip package (MCP) test system including the interface board, and an MCP test method using the MCP test systemSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 2, 2019·1 cites·18 claims
- 0348US2015198658A1Method and equipment for testing semiconductor apparatuses simultaneously and continuouslySAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 0447US7368933B2Method for testing standby current of semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 6, 2008·1 cites·16 claims
- 0538US9183950B2Memory cardSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 10, 2015·0 cites·4 claims
- 0636US8769353B2Memory cardYANG YUN-BO·Filed 2011·Granted Jul 1, 2014·0 cites·11 claims
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