Inventor · disambiguated record
Gerald L. Cadloni
Also filed as: CADLONI GERALD · CADLONI GERALD L · CADLONI GERALD LAWRENCE
46 granted patents·2 pending applications·136 citations·filing 1993–2025
97Inventor score
Top patents by PatentIndex Score
48 records- 0197US8862969B2Memory quality monitor based compensation method and apparatusMICRON TECHNOLOGY INC·Filed 2013·Granted Oct 14, 2014·28 cites·23 claims
- 0295US11709732B2Mitigating read disturb effects in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·3 cites·20 claims
- 0394US11715530B2Offset memory component automatic calibration (autocal) error recovery for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 1, 2023·2 cites·18 claims
- 0493US11953980B2Memory sub-system with dynamic calibration using component-based function(s)MICRON TECHNOLOGY INC·Filed 2022·Granted Apr 9, 2024·1 cites·20 claims
- 0593US11714709B2Enhanced block management for a memory subsystemMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 1, 2023·2 cites·20 claims
- 0693US10529433B1Offset memory component automatic calibration (AUTOCAL) error recovery for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Jan 7, 2020·10 cites·13 claims
- 0793US8499227B2Memory quality monitor based compensation method and apparatusLIIKANEN BRUCE A·Filed 2010·Granted Jul 30, 2013·21 cites·31 claims
- 0892US11526393B2Memory sub-system with dynamic calibration using component-based function(s)MICRON TECHNOLOGY INC·Filed 2021·Granted Dec 13, 2022·2 cites·20 claims
- 0992US11188416B2Enhanced block management for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 30, 2021·7 cites·20 claims
- 1092US10770168B2Memory sub-system with background scan and histogram statisticsMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 8, 2020·6 cites·17 claims
- 1190US10990466B2Memory sub-system with dynamic calibration using component-based function(s)MICRON TECHNOLOGY INC·Filed 2018·Granted Apr 27, 2021·6 cites·22 claims
- 1288US11379304B1Mitigating read disturb effects in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 5, 2022·2 cites·20 claims
- 1386US10446241B1Automatic calibration (autocal) error recovery for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 15, 2019·7 cites·20 claims
- 1485US10936246B2Dynamic background scan optimization in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 2, 2021·3 cites·19 claims
- 1584US12265447B2Memory sub-system with dynamic calibration using component-based function(s)MICRON TECHNOLOGY INC·Filed 2024·Granted Apr 1, 2025·0 cites·20 claims
- 1682US11669398B2Memory components with ordered sweep error recoveryMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 6, 2023·1 cites·20 claims
- 1782US2025225021A1Memory sub-system with dynamic calibration using component-based function(s)MICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 1880US9985651B2Read threshold calibration for LDPCMICRON TECHNOLOGY INC·Filed 2017·Granted May 29, 2018·3 cites·19 claims
- 1979US11545227B2Threshold voltage offset bin selection based on die family in memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 3, 2023·1 cites·18 claims
- 2077US9306600B2Read threshold calibration for LDPCMICRON TECHNOLOGY INC·Filed 2014·Granted Apr 5, 2016·3 cites·26 claims
- 2176US11361833B2Offset memory component automatic calibration (autocal) error recovery for a memory subsystemMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 14, 2022·2 cites·19 claims
- 2275US9081717B2Memory quality monitor based compensation method and apparatusMICRON TECHNOLOGY INC·Filed 2014·Granted Jul 14, 2015·3 cites·20 claims
- 2374US11714580B2Dynamic background scan optimization in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 1, 2023·0 cites·16 claims
- 2474US8627165B2Bitwise operations and apparatus in a multi-level systemLIIKANEN BRUCE A·Filed 2009·Granted Jan 7, 2014·7 cites·23 claims
- 2573US10896092B2Memory components with ordered sweep error recoveryMICRON TECHNOLOGY INC·Filed 2018·Granted Jan 19, 2021·1 cites·20 claims
- 2671US11705215B2Memory sub-system with background scan and histogram statisticsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 18, 2023·0 cites·18 claims
- 2770US11791004B2Threshold voltage offset bin selection based on die family in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 2870US10535417B2Memory system quality margin analysis and configurationMICRON TECHNOLOGY INC·Filed 2018·Granted Jan 14, 2020·2 cites·20 claims
- 2969US11687408B2Memory sub-system codeword quality metrics streamingMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 27, 2023·0 cites·21 claims
- 3069US11392328B2Dynamic background scan optimization in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 19, 2022·0 cites·20 claims
- 3166US11264116B2Memory sub-system with background scan and histogram statisticsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 1, 2022·0 cites·20 claims
- 3263US11335425B2Memory system quality integral analysis and configurationMICRON TECHNOLOGY INC·Filed 2020·Granted May 17, 2022·0 cites·20 claims
- 3363US10825540B2Memory system quality integral analysis and configurationMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 3, 2020·1 cites·20 claims
- 3460US10761769B2Accessible accumulated memory temperature readings in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 1, 2020·1 cites·20 claims
- 3558US10242751B2Method and apparatus for providing preloaded non-volatile memory contentMICRON TECHNOLOGY INC·Filed 2015·Granted Mar 26, 2019·1 cites·27 claims
- 3657US9692449B2Read threshold calibration for LDPCMICRON TECHNOLOGY INC·Filed 2016·Granted Jun 27, 2017·0 cites·20 claims
- 3756US10355815B2Bitwise operations and apparatus in a multi-level systemMICRON TECHNOLOGY INC·Filed 2016·Granted Jul 16, 2019·0 cites·2 claims
- 3855US6307705B1Method and apparatus for reducing track switch latency in a disk driveIBM·Filed 1993·Granted Oct 23, 2001·10 cites·41 claims
- 3953US11127479B2Memory system quality margin analysis and configurationMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 21, 2021·0 cites·20 claims
- 4052US10509579B2Memory system quality threshold intersection analysis and configurationMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 17, 2019·0 cites·20 claims
- 4150US10878910B2Memory start voltage managementMICRON TECHNOLOGY INC·Filed 2019·Granted Dec 29, 2020·0 cites·29 claims
- 4248US11138068B2Memory sub-system codeword quality metrics streamingMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 5, 2021·0 cites·10 claims
- 4347US9374343B2Bitwise operations and apparatus in a multi-level systemMICRON TECHNOLOGY INC·Filed 2013·Granted Jun 21, 2016·0 cites·10 claims
- 4446US10762968B2Dynamic user-selectable trim profile in a memory componentMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 1, 2020·0 cites·20 claims
- 4546US10482965B1Memory start voltage managementMICRON TECHNOLOGY INC·Filed 2018·Granted Nov 19, 2019·0 cites·23 claims
- 4639US11113129B2Real time block failure analysis for a memory sub-systemMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 7, 2021·0 cites·18 claims
- 4736US2019354312A1Memory system with a variable sampling rate mechanismMICRON TECHNOLOGY INC·Filed 2018·Application pending·0 cites
- 4835US9082474B2Method and apparatus for providing preloaded non-volatile memory contentCADLONI GERALD L·Filed 2011·Granted Jul 14, 2015·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →