Inventor · disambiguated record
Hidetsugu Ishida
Also filed as: ISHIDA HIDETSUGU
3 granted patents·254 citations·filing 1996–2000
78Inventor score
Files withHITACHI LTD3
Top patents by PatentIndex Score
3 records- 0191US5936726AInspection method, inspection apparatus and method of production of semiconductor device using themHITACHI LTD·Filed 1996·Granted Aug 10, 1999·122 cites·17 claims
- 0288US6198157B1Semiconductor device having buried boron and carbon regionsHITACHI LTD·Filed 1998·Granted Mar 6, 2001·108 cites·11 claims
- 0379US6635950B1Semiconductor device having buried boron and carbon regions, and method of manufacture thereofHITACHI LTD·Filed 2000·Granted Oct 21, 2003·24 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →