Inventor · disambiguated record
Qiu-Yue Duan
Also filed as: DUAN QIU- YUE
5 granted patents·5 pending applications·10 citations·filing 2007–2024
70Inventor score
Top patents by PatentIndex Score
10 records- 0184US11435400B1Test coverage rate improvement system for pins of tested circuit board and method thereofINVENTEC PUDONG TECH CORP·Filed 2021·Granted Sep 6, 2022·2 cites·8 claims
- 0282US12025660B2System of performing boundary scan test on pin through test point and method thereofINVENTEC PUDONG TECH CORP·Filed 2022·Granted Jul 2, 2024·1 cites·18 claims
- 0377US8381034B2Method for testing server supporting intelligent platform management interfaceINVENTEC CORP·Filed 2010·Granted Feb 19, 2013·6 cites·9 claims
- 0467US7730358B2Stress testing method of file systemINVENTEC CORP·Filed 2007·Granted Jun 1, 2010·1 cites·18 claims
- 0555US12429521B2JTAG standard pin test systemSQ TECH SHANGHAI CORPORATION·Filed 2024·Granted Sep 30, 2025·0 cites·9 claims
- 0645US2009083585A1Method of pressure testing for peripheral component interconnect (pci) bus stageINVENTEC CORP·Filed 2007·Application pending·0 cites
- 0743US2008201605A1Dead man timer detecting method, multiprocessor switching method and processor hot plug support methodINVENTEC CORP·Filed 2007·Application pending·0 cites
- 0842US2010205420A1System and method for realizing remote test on computer apparatus without storage deviceINVENTEC CORP·Filed 2009·Application pending·0 cites
- 0936US2021389368A1Design System For Test Adaptor Card And Method ThereofINVENTEC PUDONG TECH CORP·Filed 2020·Application pending·0 cites
- 1036US2019178940A1System For Using Different Scan Chains To Test Differential Circuit, And Method ThereofINVENTEC PUDONG TECH CORP·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →