Inventor · disambiguated record
Mei-Chen Chen
Also filed as: CHEN MEI-CHEN
3 granted patents·10 citations·filing 2014–2016
56Inventor score
Files withUNITED MICROELECTRONICS CORP3
Top patents by PatentIndex Score
3 records- 0189US9653404B1Overlay target for optically measuring overlay alignment of layers formed on semiconductor waferUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 16, 2017·10 cites·20 claims
- 0244US9373505B2Mark segmentation method and method for manufacturing a semiconductor structure applying the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jun 21, 2016·0 cites·18 claims
- 0340US9530646B2Method of forming a semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →