Inventor · disambiguated record
Kuei-Chi Juan
Also filed as: JUAN KUEI-CHI
1 granted patent·1 pending application·3 citations·filing 2001–2010
21Inventor score
Technology areasH10P
Files withKUO SUNG-NIEN1
Top patents by PatentIndex Score
2 records- 0157US8283941B2Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluationKUO SUNG-NIEN·Filed 2010·Granted Oct 9, 2012·3 cites·18 claims
- 0228US2002182826A1Fabrication method for a shallow trench isolation structureFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →