Inventor · disambiguated record

Yuan-Yu Hsieh

Also filed as: HSIEH YUAN-YU

1 granted patent·3 citations·filing 2010–2010

21Inventor score

Technology areasH10P

Files withKUO SUNG-NIEN1

Top patents by PatentIndex Score

1 record

0157US8283941B2Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluationKUO SUNG-NIEN·Filed 2010·Granted Oct 9, 2012·3 cites·18 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →