Inventor · disambiguated record
James L. Bertsch
Also filed as: BERTSCH JAMES · BERTSCH JAMES L
36 granted patents·3 pending applications·1,342 citations·filing 1994–2020
98Inventor score
Files withAGILENT TECHNOLOGIES INC25HEWLETT PACKARD CO8RUSS CHARLES W IV2BERTSCH JAMES L1LOUCKS JR HARVEY D1
Top patents by PatentIndex Score
39 records- 0198US6653626B2Ion sampling for APPI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2002·Granted Nov 25, 2003·107 cites·26 claims
- 0298US5750988AOrthogonal ion sampling for APCI mass spectrometryHEWLETT PACKARD CO·Filed 1997·Granted May 12, 1998·200 cites·11 claims
- 0396US6646257B1Multimode ionization sourceAGILENT TECHNOLOGIES INC·Filed 2002·Granted Nov 11, 2003·74 cites·17 claims
- 0495US5838003AIonization chamber and mass spectrometry system containing an asymmetric electrodeHEWLETT PACKARD CO·Filed 1996·Granted Nov 17, 1998·137 cites·32 claims
- 0595US5736741AIonization chamber and mass spectrometry system containing an easily removable and replaceable capillaryHEWLETT PACKARD CO·Filed 1996·Granted Apr 7, 1998·105 cites·19 claims
- 0694US7064322B2Mass spectrometer multipole deviceAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jun 20, 2006·41 cites·28 claims
- 0793US7488953B2Multimode ionization sourceAGILENT TECHNOLOGIES INC·Filed 2006·Granted Feb 10, 2009·16 cites·8 claims
- 0893US5495108AOrthogonal ion sampling for electrospray LC/MSHEWLETT PACKARD CO·Filed 1994·Granted Feb 27, 1996·105 cites·19 claims
- 0992US8890086B1Ion detector response equalization for enhanced dynamic rangeAGILENT TECHNOLOGIES INC·Filed 2013·Granted Nov 18, 2014·21 cites·20 claims
- 1092US8039795B2Ion sources for improved ionizationAGILENT TECHNOLOGIES INC·Filed 2009·Granted Oct 18, 2011·17 cites·22 claims
- 1192US6359275B1Dielectric conduit with end electrodesAGILENT TECHNOLOGIES INC·Filed 1999·Granted Mar 19, 2002·103 cites·40 claims
- 1292US5753910AAngled chamber seal for atmospheric pressure ionization mass spectrometryHEWLETT PACKARD CO·Filed 1996·Granted May 19, 1998·98 cites·26 claims
- 1390US7078681B2Multimode ionization sourceAGILENT TECHNOLOGIES INC·Filed 2003·Granted Jul 18, 2006·29 cites·42 claims
- 1489US8193489B2Converging multipole ion guide for ion beam shapingBERTSCH JAMES L·Filed 2009·Granted Jun 5, 2012·17 cites·22 claims
- 1586US7423262B2Precision segmented ion trapAGILENT TECHNOLOGIES INC·Filed 2005·Granted Sep 9, 2008·9 cites·18 claims
- 1686US7329879B2Apparatus for manipulation of ions and methods of making apparatusAGILENT TECHNOLOGIES INC·Filed 2005·Granted Feb 12, 2008·8 cites·17 claims
- 1785US7309859B2Ion sampling for APPI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2005·Granted Dec 18, 2007·6 cites·10 claims
- 1884US8530832B2Ion sources for improved ionizationMORDEHAI ALEXANDER·Filed 2011·Granted Sep 10, 2013·6 cites·20 claims
- 1984US6032876AApparatus for forming liquid droplets having a mechanically fixed inner microtubeHEWLETT PACKARD CO·Filed 1998·Granted Mar 7, 2000·56 cites·6 claims
- 2083US7507955B2Mass spectrometer multipole deviceAGILENT TECHNOLOGIES INC·Filed 2006·Granted Mar 24, 2009·5 cites·23 claims
- 2182US6797946B2Orthogonal ion sampling for APCI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2003·Granted Sep 28, 2004·12 cites·12 claims
- 2281US6639216B2Orthogonal ion sampling for APCI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2002·Granted Oct 28, 2003·11 cites·26 claims
- 2381US6498343B2Orthogonal ion sampling for APCI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 24, 2002·12 cites·57 claims
- 2479US8481963B2Ion slicer with accelleration and decelleration opticsLOUCKS JR HARVEY D·Filed 2012·Granted Jul 9, 2013·5 cites·20 claims
- 2578US6294779B1Orthogonal ion sampling for APCI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 1998·Granted Sep 25, 2001·36 cites·16 claims
- 2678USRE36892EOrthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometryAGILENT TECHNOLOGIES INC·Filed 1997·Granted Oct 3, 2000·28 cites·19 claims
- 2776US9536723B1Thin field terminator for linear quadrupole ion guides, and related systems and methodsAGILENT TECHNOLOGIES INC·Filed 2015·Granted Jan 3, 2017·2 cites·20 claims
- 2876US9449804B2Dual field multipole converging ion guides, hyperbolic ion guides, and related methodsAGILENT TECHNOLOGIES INC·Filed 2014·Granted Sep 20, 2016·3 cites·20 claims
- 2976US5726447AIonization chamber and mass spectrometer having a corona needle which is externally removable from a closed ionization chamberHEWLETT PACKARD CO·Filed 1996·Granted Mar 10, 1998·36 cites·36 claims
- 3075US7002146B2Ion sampling for APPI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2004·Granted Feb 21, 2006·8 cites·8 claims
- 3174US6812459B2Ion sampling for APPI mass spectrometryAGILENT TECHNOLOGIES INC·Filed 2003·Granted Nov 2, 2004·7 cites·21 claims
- 3267US6849846B2Precision multiple electrode ion mirrorAGILENT TECHNOLOGIES INC·Filed 2002·Granted Feb 1, 2005·11 cites·32 claims
- 3356US11152199B2Multipole ion optic assemblyAGILENT TECHNOLOGIES INC·Filed 2019·Granted Oct 19, 2021·0 cites·20 claims
- 3449US11480181B2Vacuum system with a multi-stage and multi-inlet vacuum pump with a directional element separating pump stagesPFEIFFER VACUUM GMBH·Filed 2020·Granted Oct 25, 2022·0 cites·18 claims
- 3548US6278110B1Orthogonal ion sampling for APCI mass spectrometryHEWLETT PACKARD CO·Filed 1998·Granted Aug 21, 2001·11 cites·4 claims
- 3648US2008087815A1Time division multiplexing MS with beam converging capillaryAGILENT TECHNOLOGIES INC·Filed 2006·Application pending·0 cites
- 3747US2007205361A1Pulsed internal lock mass for axis calibrationRUSS CHARLES W IV·Filed 2006·Application pending·0 cites
- 3847US2007200060A1Pulsed internal lock mass for axis calibrationRUSS CHARLES W IV·Filed 2006·Application pending·0 cites
- 3940US10147595B2Quadrupole rod assemblyAGILENT TECHNOLOGIES INC·Filed 2017·Granted Dec 4, 2018·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when James L. Bertsch files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →