Inventor · disambiguated record

Shu-Yun Liao

Also filed as: LIAO SHU-YUN

2 granted patents·0 citations·filing 2005–2008

27Inventor score

Technology areasH10P

Files withCHENG YEH-SHENG1 UNITED MICROELECTRONICS CORP1

Top patents by PatentIndex Score

2 records

0141US7514278B2Test-key for checking interconnect and corresponding checking methodUNITED MICROELECTRONICS CORP·Filed 2005·Granted Apr 7, 2009·0 cites·11 claims
0240US8278765B2Test-key for checking interconnectCHENG YEH-SHENG·Filed 2008·Granted Oct 2, 2012·0 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →