Inventor · disambiguated record
Mincheol Kwak
Also filed as: KWAK MINCHEOL
1 granted patent·4 pending applications·0 citations·filing 2020–2024
1Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0159US2025012736A1Method of optimizing overlay measurement condition and overlay measurement method using overlay measurement conditionSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0252US2024152064A1Photolithography method and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0347US2025233029A1Semiconductor device and test method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0445US2025210076A1Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0535US11380552B2Method of manufacturing integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 5, 2022·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →