Inventor · disambiguated record
Jiutao Li
Also filed as: LI JIUTAO
51 granted patents·16 pending applications·868 citations·filing 2001–2014
99Inventor score
Top patents by PatentIndex Score
67 records- 0198US6800504B2Integrated circuit device and fabrication using metal-doped chalcogenide materialsMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 5, 2004·251 cites·22 claims
- 0296US6730547B2Integrated circuit device and fabrication using metal-doped chalcogenide materialsMICRON TECHNOLOGY INC·Filed 2002·Granted May 4, 2004·60 cites·7 claims
- 0396US6709958B2Integrated circuit device and fabrication using metal-doped chalcogenide materialsMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 23, 2004·61 cites·26 claims
- 0495US6955940B2Method of forming chalcogenide comprising devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 18, 2005·68 cites·26 claims
- 0594US7564631B2Method and apparatus providing graded-index microlensesAPTINA IMAGING CORP·Filed 2007·Granted Jul 21, 2009·22 cites·14 claims
- 0694US7432148B2Shallow trench isolation by atomic-level silicon reconstructionMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 7, 2008·31 cites·30 claims
- 0794US6734455B2Agglomeration elimination for metal sputter deposition of chalcogenidesMICRON TECHNOLOGY INC·Filed 2001·Granted May 11, 2004·48 cites·65 claims
- 0891US7358103B2Method of fabricating an imaging device for collecting photonsMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 15, 2008·12 cites·15 claims
- 0990US7723713B2Layered resistance variable memory device and method of fabricationMICRON TECHNOLOGY INC·Filed 2006·Granted May 25, 2010·14 cites·7 claims
- 1090US7199347B2Layered microlens structures and devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 3, 2007·10 cites·8 claims
- 1189US6890790B2Co-sputter deposition of metal-doped chalcogenidesMICRON TECHNOLOGY INC·Filed 2002·Granted May 10, 2005·26 cites·6 claims
- 1288US7348205B2Method of forming resistance variable devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Mar 25, 2008·13 cites·52 claims
- 1387US7723767B2High dielectric constant transition metal oxide materialsMICRON TECHNOLOGY INC·Filed 2006·Granted May 25, 2010·8 cites·23 claims
- 1487US7724439B2Lens, a lens array and imaging device and system having a lens, and method of forming the sameAPTINA IMAGING CORP·Filed 2007·Granted May 25, 2010·16 cites·23 claims
- 1587US7446393B2Co-sputter deposition of metal-doped chalcogenidesMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 4, 2008·5 cites·5 claims
- 1686USRE44637EMethod of fabricating an imaging device for collecting photonsLI JIN·Filed 2010·Granted Dec 10, 2013·3 cites·15 claims
- 1786US7745900B2Method and apparatus providing refractive index structure for a device capturing or displaying imagesMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 29, 2010·8 cites·26 claims
- 1885US8263958B2Layered resistance variable memory device and method of fabricationCAMPBELL KRISTY A·Filed 2010·Granted Sep 11, 2012·6 cites·18 claims
- 1984US7763499B2CMOS front end process compatible low stress light shieldMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 27, 2010·6 cites·19 claims
- 2084US6878569B2Agglomeration elimination for metal sputter deposition of chalcogenidesMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 12, 2005·18 cites·11 claims
- 2181US7317579B2Method and apparatus providing graded-index microlensesMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 8, 2008·4 cites·7 claims
- 2281US7087919B2Layered resistance variable memory device and method of fabricationMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 8, 2006·28 cites·58 claims
- 2380US7728330B2CMOS imager with nitrided gate oxide and method of fabricationAPTINA IMAGING CORP·Filed 2005·Granted Jun 1, 2010·5 cites·19 claims
- 2480US7646551B2Microlenses with patterned holes to produce a desired focus locationAPTINA IMAGING CORP·Filed 2007·Granted Jan 12, 2010·5 cites·25 claims
- 2579US6660136B2Method of forming a non-volatile resistance variable device and method of forming a metal layer comprising silver and tungstenMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·22 cites·53 claims
- 2678US7385167B2CMOS front end process compatible low stress light shieldMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 10, 2008·19 cites·81 claims
- 2777US7473378B2Method and apparatus providing graded-index microlensesAPTINA IMAGING CORP·Filed 2006·Granted Jan 6, 2009·3 cites·9 claims
- 2876US7733567B2Method and apparatus for reducing microlens surface reflectionAPTINA IMAGING CORP·Filed 2005·Granted Jun 8, 2010·7 cites·32 claims
- 2975US7205526B2Methods of fabricating layered lens structuresMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 17, 2007·12 cites·15 claims
- 3075US7172947B2High dielectric constant transition metal oxide materialsMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 6, 2007·11 cites·30 claims
- 3174US6825135B2Elimination of dendrite formation during metal/chalcogenide glass depositionMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 30, 2004·9 cites·13 claims
- 3272US8791519B2High dielectric constant transition metal oxide materialsLI JIUTAO·Filed 2010·Granted Jul 29, 2014·2 cites·17 claims
- 3372US7612319B2Method and apparatus providing a microlens for an image sensorAPTINA IMAGING CORP·Filed 2006·Granted Nov 3, 2009·2 cites·35 claims
- 3471US7365305B2Layered lens structures and methods of production in which radius of curvature of the upper lens can be variedMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 29, 2008·1 cites·18 claims
- 3571US6858465B2Elimination of dendrite formation during metal/chalcogenide glass depositionMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 22, 2005·7 cites·17 claims
- 3670US8821697B2Silver selenide sputtered films and method and apparatus for controlling defect formation in silver selenide sputtered filmsMICRON TECHNOLOGY INC·Filed 2012·Granted Sep 2, 2014·0 cites·15 claims
- 3770US7863597B2Resistance variable memory devices with passivating materialMICRON TECHNOLOGY INC·Filed 2008·Granted Jan 4, 2011·3 cites·20 claims
- 3869US6974965B2Agglomeration elimination for metal sputter deposition of chalcogenidesMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 13, 2005·7 cites·11 claims
- 3968US7964436B2Co-sputter deposition of metal-doped chalcogenidesROUND ROCK RES LLC·Filed 2008·Granted Jun 21, 2011·0 cites·10 claims
- 4066US7410863B2Methods of forming and using memory cell structuresMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 12, 2008·2 cites·21 claims
- 4166US7049009B2Silver selenide film stoichiometry and morphology control in sputter depositionMICRON TECHNOLOGY INC·Filed 2004·Granted May 23, 2006·6 cites·15 claims
- 4265US7202104B2Co-sputter deposition of metal-doped chalcogenidesMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 10, 2007·4 cites·22 claims
- 4364US2011180695A1Layered lens structures and methods of productionROUND ROCK RES LLC·Filed 2011·Application pending·0 cites
- 4462US7528401B2Agglomeration elimination for metal sputter deposition of chalcogenidesMICRON TECHNOLOGY INC·Filed 2004·Granted May 5, 2009·4 cites·11 claims
- 4562US7364644B2Silver selenide film stoichiometry and morphology control in sputter depositionMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 29, 2008·5 cites·56 claims
- 4662US6949453B2Agglomeration elimination for metal sputter deposition of chalcogenidesMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 27, 2005·4 cites·25 claims
- 4760US9552986B2Forming a memory device using sputtering to deposit silver-selenide filmMICRON TECHNOLOGY INC·Filed 2014·Granted Jan 24, 2017·0 cites·9 claims
- 4859US7799180B2Silver selenide sputtered films and method and apparatus for controlling defect formation in silver selenide sputtered filmsMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 21, 2010·2 cites·89 claims
- 4959US2015001673A1High dielectric constant transition metal oxide materialsMICRON TECHNOLOGY INC·Filed 2014·Application pending·0 cites
- 5058US2011014115A1Silver selenide sputtered films and method and apparatus for controlling defect formation in silver selenide sputtered filmsLI JIUTAO·Filed 2010·Application pending·0 cites
Showing the top 50 of 67 patent records by PatentIndex Score.
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