Inventor · disambiguated record
Kenneth P. Parker
Also filed as: PARKER KENNETH C · PARKER KENNETH P · PARKER KENNETH PAUL
42 granted patents·8 pending applications·693 citations·filing 1992–2008
98Inventor score
Files withAGILENT TECHNOLOGIES INC31HEWLETT PACKARD CO10PARKER KENNETH P5JACOBSEN CHRIS R2VERIGY IPCO1
Top patents by PatentIndex Score
50 records- 0191US7068039B2Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing sameAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jun 27, 2006·46 cites·6 claims
- 0291US6097203AIntegrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitryAGILENT TECHNOLOGIES INC·Filed 1998·Granted Aug 1, 2000·79 cites·12 claims
- 0390US6087842AIntegrated or intrapackage capability for testing electrical continuity between an integrated circuit and other circuitryAGILENT TECHNOLOGIES INC·Filed 1996·Granted Jul 11, 2000·73 cites·23 claims
- 0488US7123022B2Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assembliesAGILENT TECHNOLOGIES INC·Filed 2004·Granted Oct 17, 2006·35 cites·7 claims
- 0584US7307427B2Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boardsAGILENT TECHNOLOGIES INC·Filed 2005·Granted Dec 11, 2007·15 cites·13 claims
- 0681US5968191AMethod and apparatus for testing integrated circuits in a mixed-signal environmentHEWLETT PACKARD CO·Filed 1997·Granted Oct 19, 1999·57 cites·22 claims
- 0781US5513188AEnhanced interconnect testing through utilization of board topology dataHEWLETT PACKARD CO·Filed 1994·Granted Apr 30, 1996·46 cites·20 claims
- 0879US6933730B2Methods and apparatus for testing continuity of electrical paths through connectors of circuit assembliesAGILENT TECHNOLOGIES INC·Filed 2003·Granted Aug 23, 2005·20 cites·22 claims
- 0976US6960917B2Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assembliesAGILENT TECHNOLOGIES INC·Filed 2003·Granted Nov 1, 2005·20 cites·24 claims
- 1075US7259576B2Method and apparatus for a twisting fixture probe for probing test access point structuresAGILENT TECHNOLOGIES INC·Filed 2005·Granted Aug 21, 2007·8 cites·14 claims
- 1175US6452410B1Apparatus and method for electrolytic bare board testingAGILENT TECHNOLOGIES INC·Filed 2000·Granted Sep 17, 2002·19 cites·8 claims
- 1274US5270642APartitioned boundary-scan testing for the reduction of testing-induced damageHEWLETT PACKARD CO·Filed 1992·Granted Dec 14, 1993·34 cites·20 claims
- 1368US7295031B1Method for non-contact testing of marginal integrated circuit connectionsAGILENT TECHNOLOGIES INC·Filed 2006·Granted Nov 13, 2007·6 cites·14 claims
- 1467US7518384B2Method and apparatus for manufacturing and probing test probe access structures on viasAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 14, 2009·4 cites·9 claims
- 1567US7325219B2Method and apparatus for determining probing locations for a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jan 29, 2008·5 cites·22 claims
- 1667US7208957B2Method for non-contact testing of fixed and inaccessible connections without using a sensor plateAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 24, 2007·5 cites·18 claims
- 1764US7307426B2Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devicesAGILENT TECHNOLOGIES INC·Filed 2005·Granted Dec 11, 2007·4 cites·29 claims
- 1863US6389565B2Mechanism and display for boundary-scan debugging informationAGILENT TECHNOLOGIES INC·Filed 1998·Granted May 14, 2002·29 cites·20 claims
- 1963US5510704APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1995·Granted Apr 23, 1996·22 cites·10 claims
- 2062US7170298B2Methods for testing continuity of electrical paths through connectors of circuit assembliesAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jan 30, 2007·3 cites·4 claims
- 2162US5260649APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1992·Granted Nov 9, 1993·19 cites·24 claims
- 2261US6763486B2Method and apparatus of boundary scan testing for AC-coupled differential data pathsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Jul 13, 2004·9 cites·19 claims
- 2360US7190157B2Method and apparatus for layout independent test point placement on a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2004·Granted Mar 13, 2007·8 cites·10 claims
- 2458US7224169B2Methods and apparatus for non-contact testing and diagnosing of inaccessible shorted connectionsAGILENT TECHNOLOGIES INC·Filed 2004·Granted May 29, 2007·7 cites·11 claims
- 2558US5402427ACircuit tester with coincident sequencing of independently compressed test data matrix segmentsHEWLETT PACKARD CO·Filed 1992·Granted Mar 28, 1995·19 cites·14 claims
- 2655US7504589B2Method and apparatus for manufacturing and probing printed circuit board test access point structuresAGILENT TECHNOLOGIES INC·Filed 2004·Granted Mar 17, 2009·5 cites·8 claims
- 2755US7307222B2Printed circuit board test access point structures and method for making the sameAGILENT TECHNOLOGIES INC·Filed 2003·Granted Dec 11, 2007·6 cites·6 claims
- 2854US6792385B2Methods and apparatus for characterizing board test coverageAGILENT TECHNOLOGIES INC·Filed 2002·Granted Sep 14, 2004·8 cites·30 claims
- 2950US7161369B2Method and apparatus for a wobble fixture probe for probing test access point structuresAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jan 9, 2007·4 cites·6 claims
- 3050US5448166APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1993·Granted Sep 5, 1995·12 cites·8 claims
- 3149US7437638B2Boundary-Scan methods and apparatusAGILENT TECHNOLOGIES INC·Filed 2002·Granted Oct 14, 2008·4 cites·10 claims
- 3249US6948140B2Methods and apparatus for characterizing board test coverageAGILENT TECHNOLOGIES INC·Filed 2002·Granted Sep 20, 2005·6 cites·36 claims
- 3346US5760596ATesting series passive components without contacting the driven nodeHEWLETT PACKARD CO·Filed 1997·Granted Jun 2, 1998·12 cites·7 claims
- 3445US6895565B2Methods for predicting board test coverageAGILENT TECHNOLOGIES INC·Filed 2002·Granted May 17, 2005·2 cites·28 claims
- 3545US2008148208A1Method for improving a printed circuit board development cycleJACOBSEN CHRIS R·Filed 2008·Application pending·0 cites
- 3644US5751737ABoundary scan testing deviceHEWLETT PACKARD CO·Filed 1997·Granted May 12, 1998·16 cites·3 claims
- 3742US5387862APowered testing of mixed conventional/boundary-scan logicHEWLETT PACKARD CO·Filed 1993·Granted Feb 7, 1995·8 cites·8 claims
- 3842US2007007978A1Method and Apparatus for Non-Contact Testing and Diagnosing Electrical Paths Through Connectors on Circuit AssembliesPARKER KENNETH P·Filed 2006·Application pending·0 cites
- 3941US7187165B2Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture buildAGILENT TECHNOLOGIES INC·Filed 2004·Granted Mar 6, 2007·3 cites·14 claims
- 4041US6744256B2Boundary-scan testing of opto-electronic devicesAGILENT TECHNOLOGIES INC·Filed 2001·Granted Jun 1, 2004·1 cites·25 claims
- 4141US2006103397A1Method and apparatus for a twisting fixture probe for probing test access point structuresPARKER KENNETH P·Filed 2004·Application pending·0 cites
- 4241US2008297168A1Methods and apparatus for testing one or more differential signaling channels for opensPARKER KENNETH P·Filed 2008·Application pending·0 cites
- 4340US7362106B2Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodesAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 22, 2008·0 cites·21 claims
- 4440US2008315892A1Methods and apparatus using one or more supernodes when testing for shorts between nodes of a circuit assemblyPARKER KENNETH P·Filed 2008·Application pending·0 cites
- 4538US6243843B1Post-mission test method for checking the integrity of a boundary scan testAGILENT TECHNOLOGIES INC·Filed 1995·Granted Jun 5, 2001·8 cites·16 claims
- 4637US6243853B1Development of automated digital libraries for in-circuit testing of printed curcuit boardsAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jun 5, 2001·6 cites·21 claims
- 4736US7137052B2Methods and apparatus for minimizing current surges during integrated circuit testingVERIGY IPCO·Filed 2001·Granted Nov 14, 2006·0 cites·23 claims
- 4836US2006129955A1Printed circuit board development cycle using probe location automation and bead probe technologyJACOBSEN CHRIS R·Filed 2004·Application pending·0 cites
- 4935US2005253616A1Method and apparatus for testing and diagnosing electrical paths through area array integrated circuitsPARKER KENNETH P·Filed 2004·Application pending·0 cites
- 5034US2002120404A1Methods and apparatus for mass fingerprinting of biomoleculesFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →