Inventor · disambiguated record
Thomas Hladschik
Also filed as: HLADSCHIK THOMAS
4 granted patents·73 citations·filing 1999–2003
77Inventor score
Top patents by PatentIndex Score
4 records- 0173US6564346B1Advanced bit fail map compression with fail signature analysisINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted May 13, 2003·43 cites·33 claims
- 0271US6493645B1Method for detecting and classifying scratches occurring during wafer semiconductor processingINFINEON TECHNOLOGIES CORP·Filed 2000·Granted Dec 10, 2002·18 cites·13 claims
- 0361US6963813B1Method and apparatus for fast automated failure classification for semiconductor wafersRATHEI DIETER·Filed 2000·Granted Nov 8, 2005·9 cites·15 claims
- 0437US7003432B2Method of and system for analyzing cells of a memory deviceINFINEON TECHNOLOGIES RICHMOND·Filed 2003·Granted Feb 21, 2006·3 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →