Inventor · disambiguated record
Daniel Lam
Also filed as: LAM DANIEL · LAM DANIEL S · LAM DANIEL STEPHEN
10 granted patents·2 pending applications·51 citations·filing 2002–2025
86Inventor score
Top patents by PatentIndex Score
12 records- 0194US10114067B2Integrated waveguide structure and socket structure for millimeter waveband testingADVANTEST CORP·Filed 2016·Granted Oct 30, 2018·20 cites·24 claims
- 0290US9921266B1General universal device interface for automatic test equipment for semiconductor testingADVANTEST CORP·Filed 2017·Granted Mar 20, 2018·6 cites·20 claims
- 0384US10371716B2Method and apparatus for socket power calibration with flexible printed circuit boardADVANTEST CORP·Filed 2016·Granted Aug 6, 2019·3 cites·20 claims
- 0478US9921244B1Production-level modularized load board produced using a general universal device interface for automatic test equipment for semiconductor testingADVANTEST CORP·Filed 2017·Granted Mar 20, 2018·2 cites·20 claims
- 0577US10381707B2Multiple waveguide structure with single flange for automatic test equipment for semiconductor testingADVANTEST CORP·Filed 2016·Granted Aug 13, 2019·2 cites·20 claims
- 0675US9838076B2Handler with integrated receiver and signal path interface to testerADVANTEST CORP·Filed 2016·Granted Dec 5, 2017·3 cites·20 claims
- 0773US10520360B1Automated power-in-the-bucket measurement apparatus for large aperture laser systemsNORTHROP GRUMMAN SYSTEMS CORP·Filed 2018·Granted Dec 31, 2019·2 cites·20 claims
- 0866US7053640B2System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environmentAGILENT TECHNOLOGIES INC·Filed 2002·Granted May 30, 2006·12 cites·4 claims
- 0963US10393772B2Wave interface assembly for automatic test equipment for semiconductor testingADVANTEST CORP·Filed 2016·Granted Aug 27, 2019·1 cites·22 claims
- 1061US2025298077A1Antenna device and an automated test equipment with a ridged blind mating waveguide flangeMOREIRA JOSE·Filed 2025·Application pending·0 cites
- 1153US2025271480A1Probe assembly for calibrating rf power signals to a device pinADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1243US10944148B2Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testingADVANTEST CORP·Filed 2016·Granted Mar 9, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →