Inventor · disambiguated record
Yoshinori Hayamizu
Also filed as: HAYAMIZU YOSHINORI
11 granted patents·2 pending applications·321 citations·filing 1996–2010
91Inventor score
Top patents by PatentIndex Score
13 records- 0194US6544656B1Production method for silicon wafer and silicon waferSHINETSU HANDOTAI KK·Filed 2000·Granted Apr 8, 2003·127 cites·24 claims
- 0287US6478883B1Silicon single crystal wafer, epitaxial silicon wafer, and methods for producing themSHINETSU HANDOTAI KK·Filed 1999·Granted Nov 12, 2002·84 cites·21 claims
- 0384US6548035B1Silicon single crystal wafer for epitaxial wafer, epitaxial wafer, and methods for producing the same and evaluating the sameSHINETSU HANDOTAI KK·Filed 2000·Granted Apr 15, 2003·30 cites·29 claims
- 0467US8492879B2Semiconductor substrate and semiconductor deviceOHMI TADAHIRO·Filed 2008·Granted Jul 23, 2013·2 cites·4 claims
- 0566US6544332B1Method for manufacturing silicon single crystal, silicon single crystal manufactured by the method, and silicon waferSHINETSU HANDOTAI KK·Filed 2000·Granted Apr 8, 2003·6 cites·15 claims
- 0663US8187954B2Method for manufacturing silicon single crystal waferHAYAMIZU YOSHINORI·Filed 2008·Granted May 29, 2012·3 cites·1 claims
- 0761US7081422B2Manufacturing process for annealed wafer and annealed waferSHINETSU HANDOTAI KK·Filed 2001·Granted Jul 25, 2006·8 cites·14 claims
- 0858US6858094B2Silicon wafer and silicon epitaxial wafer and production methods thereforSHINETSU HANDOTAI KK·Filed 2001·Granted Feb 22, 2005·6 cites·14 claims
- 0955US6140131AMethod and apparatus for detecting heavy metals in silicon wafer bulk with high sensitivitySHINETSU HANDOTAI KK·Filed 1998·Granted Oct 31, 2000·25 cites·20 claims
- 1050US5916824AEtching method of silicon wafer surface and etching apparatus of the sameSHINETSU HANDOTAI KK·Filed 1996·Granted Jun 29, 1999·17 cites·21 claims
- 1147US6277715B1Production method for silicon epitaxial waferSHINETSU HANDOTAI KK·Filed 1999·Granted Aug 21, 2001·13 cites·16 claims
- 1240US2006121291A1Manufacturing process for annealed wafer and annealed waferSHINETSU HANDOTAI KK·Filed 2005·Application pending·0 cites
- 1333US2012001301A1Annealed wafer, method for producing annealed wafer and method for fabricating deviceEBARA KOJI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →