Inventor · disambiguated record
Ran Schleyen
Also filed as: SCHLEYEN RAN
8 granted patents·15 citations·filing 2015–2022
79Inventor score
Top patents by PatentIndex Score
8 records- 0193US11379972B2Detecting defects in semiconductor specimens using weak labelingAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jul 5, 2022·5 cites·19 claims
- 0290US11151710B1Automatic selection of algorithmic modules for examination of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Oct 19, 2021·6 cites·17 claims
- 0378US11449711B2Machine learning-based defect detection of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 20, 2022·2 cites·20 claims
- 0470US11790515B2Detecting defects in semiconductor specimens using weak labelingAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 0566US10101206B2Spectral imaging method and systemUNIV RAMOT·Filed 2015·Granted Oct 16, 2018·1 cites·20 claims
- 0662US9490101B2System and method for scanning an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Nov 8, 2016·1 cites·11 claims
- 0739US10340116B1Imaging an area that includes an upper surface and a holeAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 2, 2019·0 cites·21 claims
- 0831US9900562B2System and method for light-field imagingUNIV RAMOT·Filed 2015·Granted Feb 20, 2018·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →