Inventor · disambiguated record

Seiichi Ohmori

Also filed as: OHMORI Seiichi

2 granted patents·0 citations·filing 2019–2023

22Inventor score

Technology areasG01B G01N

Files withIHI CORP1 IHI INSPECTION AND INSTR CO LTD1

Top patents by PatentIndex Score

2 records

0147US12422254B2Thickness measurement device and thickness measurement methodIHI CORP·Filed 2023·Granted Sep 23, 2025·0 cites·4 claims
0240US11680879B2Strength testing method and strength evaluation deviceIHI INSPECTION AND INSTR CO LTD·Filed 2019·Granted Jun 20, 2023·0 cites·4 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →