Inventor · disambiguated record
Guillaume E. A. Lousberg
Also filed as: LOUSBERG GUILLAUME E A · LOUSBERG GUILLAUME ELISABETH A
7 granted patents·113 citations·filing 1997–2003
86Inventor score
Top patents by PatentIndex Score
7 records- 0180US6988230B2Test arrangement for assemblages of intergrated circuit blocksKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jan 17, 2006·27 cites·9 claims
- 0275US6131173AClock domain test isolationPHILIPS CORP·Filed 1997·Granted Oct 10, 2000·50 cites·7 claims
- 0360US6829736B1Method of testing a memoryKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Dec 7, 2004·12 cites·6 claims
- 0456US6807505B2Circuit with interconnect test unitKONINKL PHILIPS ELECTRONICS NV·Filed 2003·Granted Oct 19, 2004·7 cites·9 claims
- 0552US6721911B1Method and apparatus for testing a memory array using compressed responsesKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Apr 13, 2004·8 cites·11 claims
- 0640US6622108B1Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuitKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Sep 16, 2003·7 cites·13 claims
- 0736US6883129B2Electronic circuit and method for testingKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Apr 19, 2005·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →